MC145173

MOTOROLA

4

Symbol

Parameter

Test Condition

Guaranteed

Limit

Unit

ISTBY

Maximum Standby Supply Current

Vin on Din, CLK, INPUT A, INPUT

B, INPUT C, INPUT D = VDD or

VSS; Vin on ENB = VDD; Vin on

OSCin, HF IFin, VHF IFin = VSS or

Floating (ac coupled); Vin on HFin

= VDD or VSS or Floating (ac

coupled); Vin on VHFin = Floating

(ac coupled); Dout tied to VDD or

VSS through 100 kΩ resistor; Oth-

er Outputs Open

30

µA

Idd

Maximum Operating Supply Current

Vin on Din, CLK, INPUT A, INPUT

B, INPUT C, INPUT D = VDD or

VSS; Dout tied to VDD or VSS

through 100 k

Ω resistor; Vin on

ENB = VDD; OSCin = 10.35 MHz

@ 1 V p–p; VHFin = 120 MHz @

210 mV p–p; VHF IFin = 10.7 MHz

@ 210 mV p–p

12

mA

ANALOG CHARACTERISTICS — CURRENT SOURCE/SINK OUTPUT — VHF PDout

(Iout ≤ 2.5 mA, VDD = 4.5 to 5.5 V, Voltages Referenced to VSS)

Parameter

Test Condition

Guaranteed

Limit

Unit

Maximum Source Current Variation (Part–to–Part)

Vout = 0.5 x VDD

± 20

%

Maximum Sink–vs–Source Mismatch (Note 3)

Vout = 0.5 x VDD

12

%

Output Voltage Range (Note 3)

Iout variation ≤ 20%

1.25 to VDD – 1.25 V

V

NOTES:

1. Percentages calculated using the following formula: (Maximum Value – Minimum Value)/Maximum Value.

2. See Rx Pin Description for external resistor value.

3. This parameter is guaranteed for any specific temperature within – 40 to + 85

°C.

Parameter

Test Condition

Guaranteed

Limit

Unit

Resolution

6

Bits

Conversion Time

Per Figure 1

3584

OSCin

Cycles

Maximum Nonlinearity

Vin = VSS + (0.1 x VDD) to

VDD – (0.09 x VDD)

± 1.5

LSBs

EOC FLIP–FLOP OUTPUT

(INTERNAL)

ENB

Din

CONVERSION TIME

SET BIT C7 HIGH

IN C REGISTER

ADC READY TO BE

READ VIA SERIAL PORT

Figure 1.