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3 / 8 page  MC74AC273, MC74ACT273 www.onsemi.com 3 MAXIMUM RATINGS Symbol Parameter Value Unit VCC DC Supply Voltage (Referenced to GND) −0.5 to +7.0 V VIN DC Input Voltage (Referenced to GND) −0.5 to VCC +0.5 V VOUT DC Output Voltage (Referenced to GND) (Note 1) −0.5 to VCC +0.5 V IIK DC Input Diode Current ±20 mA IOK DC Output Diode Current ±50 mA IOUT DC Output Sink/Source Current ±50 mA ICC DC Supply Current, per Output Pin ±50 mA IGND DC Ground Current, per Output Pin ±100 mA TSTG Storage Temperature Range *65 to )150 _C TL Lead temperature, 1 mm from Case for 10 Seconds 260 _C TJ Junction Temperature Under Bias 140 _C qJA Thermal Resistance (Note 2) SOIC TSSOP 65.8 110.7 _C/W MSL Moisture Sensitivity SOIC TSSOP Level 3 Level 1 FR Flammability Rating Oxygen Index: 30% − 35% UL 94 V−0 @ 0.125 in VESD ESD Withstand Voltage Human Body Model (Note 3) Machine Model (Note 4) Charged Device Model (Note 5) > 2000 > 200 > 1000 V ILatchup Latchup Performance Above VCC and Below GND at 85_C (Note 6) ±100 mA Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. IOUT absolute maximum rating must be observed. 2. The package thermal impedance is calculated in accordance with JESD 51−7. 3. Tested to EIA/JESD22−A114−A. 4. Tested to EIA/JESD22−A115−A. 5. Tested to JESD22−C101−A. 6. Tested to EIA/JESD78. RECOMMENDED OPERATING CONDITIONS Symbol Parameter Min Typ Max Unit VCC Supply Voltage ′AC 2.0 5.0 6.0 V ′ACT 4.5 5.0 5.5 Vin, Vout DC Input Voltage, Output Voltage (Ref. to GND) 0 − VCC V tr, tf Input Rise and Fall Time (Note 7) ′AC Devices except Schmitt Inputs VCC @ 3.0 V − 150 − VCC @ 4.5 V − 40 − ns/V VCC @ 5.5 V − 25 − tr, tf Input Rise and Fall Time (Note 8) ′ACT Devices except Schmitt Inputs VCC @ 4.5 V − 10 − ns/V VCC @ 5.5 V − 8.0 − TA Operating Ambient Temperature Range −40 25 85 °C IOH Output Current − High − − −24 mA IOL Output Current − Low − − 24 mA Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. 7. VIN from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times. 8. VIN from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times. |
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