MC100LVEP210

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3

Table 2. ATTRIBUTES

Characteristics

Value

Internal Input Pulldown Resistor

75 k

W

Internal Input Pull−up Resistor

37.5 k

W

ESD Protection

Human Body Model

Machine Model

Charged Device Model

> 2 kV

> 100 V

> 2 kV

Moisture Sensitivity (Note 1)

Pb Pkg

Pb−Free Pkg

LQFP−32

QFN−32

Level 2

N/A

Level 2

Level 1

Flammability Rating

Oxygen Index: 28 to 34

UL 94 V−0 @ 0.125 in

Transistor Count

461 Devices

Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test

1. For additional information, see Application Note AND8003/D.

Table 3. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

PECL Mode Power Supply

6

V

NECL Mode Power Supply

−6

V

PECL Mode Input Voltage

NECL Mode Input Voltage

6

−6

V

V

Output Current

Continuous

Surge

50

100

mA

mA

± 0.5

mA

Operating Temperature Range

−40 to +85

°C

Storage Temperature Range

−65 to +150

°C

Thermal Resistance (Junction−to−Ambient)

0 lfpm

500 lfpm

LQFP−32

LQFP−32

80

55

°C/W

°C/W

Thermal Resistance (Junction−to−Case)

Standard Board

LQFP−32

12 to 17

°C/W

Thermal Resistance (Junction−to−Ambient)

0 lfpm

500 lfpm

QFN−32

QFN−32

31

27

°C/W

°C/W

Thermal Resistance (Junction−to−Case)

2S2P

QFN−32

12

°C/W

Wave Solder

Pb

Pb−Free

<2 to 3 sec @ 248

°C

<2 to 3 sec @ 260

°C

265

265

°C

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.