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5 / 8 page  MC10E167 www.onsemi.com 5 Table 7. 100E SERIES NECL DC CHARACTERISTICS (VCCx = 0 V; VEE = −5.0 V (Note 1)) Symbol Characteristic 0°C 25°C 85°C Unit Min Typ Max Min Typ Max Min Typ Max IEE Power Supply Current 94 113 94 113 108 130 mA VOH Output HIGH Voltage (Note 2) −1025 −950 −880 −1025 −950 −880 −1025 −950 −880 mV VOL Output LOW Voltage (Note 2) −1810 −1705 −1620 −1810 −1745 −1620 −1810 −1740 −1620 mV VIH Input HIGH Voltage −1165 −1025 −880 −1165 −1025 −880 −1165 −1025 −880 mV VIL Input LOW Voltage −1810 −1645 −1475 −1810 −1645 −1475 −1810 −1645 −1475 mV IIH Input HIGH Current 150 150 150 mA IIL Input LOW Current 0.5 0.3 0.5 0.25 0.5 0.2 mA NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 1. Input and output parameters vary 1:1 with VCC. VEE can vary −0.46 V / +0.8 V. 2. Outputs are terminated through a 50 W resistor to VCC − 2.0 V. Table 8. AC CHARACTERISTICS (VCCx = 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = −5.0 V (Note 1)) Symbol Characteristic 0°C 25°C 85°C Unit Min Typ Max Min Typ Max Min Typ Max fMAX Maximum Toggle Frequency 1000 1400 1000 1400 1000 1400 MHz tPLH tPHL Propagation Delay to Output Clk, MR 650 850 1050 650 850 1050 650 850 1050 ps ts Setup Time D SEL 100 275 − 50 125 100 275 − 50 125 100 275 − 50 125 ps th Hold Time D SEL 300 75 50 −125 300 75 50 −125 300 75 50 −125 ps tRR Reset Recovery Time 750 550 750 550 750 550 ps tPW Minimum Pulse Width Clk, MR 400 400 400 ps tSKEW Within-Device Skew (Note 2) 75 75 75 ps tJITTER Random Clock Jitter (RMS) < 1 < 1 < 1 ps tr tf Rise/Fall Times (20−80%) 300 450 800 300 450 800 300 450 800 ps NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 1. 10 Series: VEE can vary −0.46 V / +0.06 V. 100 Series: VEE can vary −0.46 V / +0.8 V. 2. Within-device skew is defined as identical transitions on similar paths through a device. |
Số phần tương tự - MC10E167FNR2G |
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Mô tả tương tự - MC10E167FNR2G |
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