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ADC128S102WGRQV bảng dữ liệu(PDF) 9 Page - Texas Instruments

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9
ADC128S102QML-SP
www.ti.com
SNAS411O – AUGUST 2008 – REVISED AUGUST 2016
Product Folder Links: ADC128S102QML-SP
Submit Documentation Feedback
Copyright © 2008–2016, Texas Instruments Incorporated
(1)
This is worse case drift, Deltas are performed at room temperature post operational life. All other parameters, no deltas are required.
6.7 Electrical Characteristics: Burn in Delta Parameters - TA at 25°C
The following specifications apply for VA = VD = 2.7 V to 5.25 V, AGND = DGND = 0 V, fSCLK = 0.8 MHz to 16 MHz, fSAMPLE =
50 kSPS to 1 MSPS, and CL = 50 pF.
(1)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
INL
Integral non-linearity
VA = VD = 3 V
–0.5
0.106
0.5
LSB
VA = VD = 5 V
–0.35
0.016
0.35
LSB
IMD
Intermodulation distortion,
second order terms
VA = VD = 3 V
–14
1.35
14
dB
VA = VD = 5 V
–17
1.67
17
dB
IMD
Intermodulation distortion, third
order terms
VA = VD = 3 V
–10
0.47
10
dB
VA = VD = 5 V
–10
0.9
10
dB
(1)
Typical figures are at TJ = 25°C, and represent most likely parametric norms.
(2)
Clock may be in any state (high or low) when CS goes high. Setup and hold time restrictions apply only to CS going low.
6.8 Timing Requirements
The following specifications apply for VA = VD = 2.7 V to 5.25 V, AGND = DGND = 0 V, fSCLK = 0.8 MHz to 16 MHz, fSAMPLE =
50 kSPS to 1 MSPS, and CL = 50 pF.
SUBGROUP
MIN
NOM(1)
MAX
UNIT
tCSH
CS hold time after SCLK rising
edge
See (2)
[9, 10, 11]
10
0
ns
tCSS
CS setup time prior to SCLK
rising edge
See (2)
[9, 10, 11]
10
4.5
ns
tEN
CS falling edge to DOUT enabled
[9, 10, 11]
5
30
ns
tDACC
DOUT access time after SCLK falling edge
[9, 10, 11]
17
27
ns
tDHLD
DOUT hold time after SCLK falling edge
[9, 10, 11]
7
ns
tDS
DIN setup time prior to SCLK rising edge
[9, 10, 11]
10
ns
tDH
DIN hold time after SCLK rising edge
[9, 10, 11]
10
ns
tCH
SCLK high time
0.4 × tSCLK
ns
tCL
SCLK low time
0.4 × tSCLK
ns
tDIS
CS rising edge to DOUT high-
impedance
DOUT falling
[9, 10, 11]
2.4
20
ns
DOUT rising
[9, 10, 11]
0.9
20
ns
(1)
MIL-STD-883, Method 5005 - Group A
Table 1. Quality Conformance Inspection(1)
SUBGROUP
DESCRIPTION
TEMP (°C)
1
Static tests at
25
2
Static tests at
125
3
Static tests at
–55
4
Dynamic tests at
25
5
Dynamic tests at
125
6
Dynamic tests at
–55
7
Functional tests at
25
8A
Functional tests at
125
8B
Functional tests at
–55
9
Switching tests at
25
10
Switching tests at
125
11
Switching tests at
–55
12
Setting time at
25
13
Setting time at
125
14
Setting time at
–55


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