LMZ21700

www.ti.com

SNVS872C – AUGUST 2012 – REVISED NOVEMBER 2014

7.5 Electrical Characteristics

(1)

Minimum and Maximum limits are specified through test, design or statistical correlation. Typical values represent the most

PARAMETER

TEST CONDITIONS

UNIT

SYSTEM PARAMETERS

Operating quiescent current

85°C

17

25

μA

device not switching

125°C

17

28

μA

device not switching

Shutdown current

1.5

4

μA

1.5

5

μA

Input under voltage lock out

2.8

2.9

3

V

rising threshold

Input under voltage lock out

0.125

0.180

0.260

V

hysteresis

Thermal shutdown

Rising Threshold

160

°C

Thermal shutdown hysteresis

30

°C

CONTROL

Enable logic HIGH voltage

0.9

V

Enable logic LOW voltage

0.3

V

Input leakage current

EN = VIN or GND

0.01

1

μA

Power Good threshold voltage

92 %

95 %

98 %

87 %

90 %

93 %

Power Good output low voltage

0.07

0.3

V

Power Good leakage current

1

400

nA

Softstart Pin source current

2.2

2.5

2.8

μA

POWER STAGE

High-Side MOSFET ON

82

m

Ω

Resistance

120

Low-Side MOSFET ON

40

m

Ω

Resistance

50

L

Integrated power inductor value

2.2

μH

DCR

Integrated power inductor DC

92

m

Ω

resistance

1.2

1.5

1.9

A

Low-Side MOSFET Current Limit

0.9

A

Output (DC) current limit

0.95

A

OUTPUT

Internal reference voltage

0.7869

0.803

0.8191

V

Feedback pin leakage current

1

100

nA

Light load initial voltage accuracy

-2.3 %

2.8 %

Resistors

Load regulation

0.05 %

/ A

PWM mode operation

(1)

Min and Max limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlation

using Statistical Quality Control (SQC) methods. Limits are used to calculate National’s Average Outgoing Quality Level (AOQL).

(2)

Typical numbers are at 25°C and represent the most likely parametric norm.

Copyright © 2012–2014, Texas Instruments Incorporated

Submit Documentation Feedback

5

Product Folder Links: LMZ21700