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LM723QML bảng dữ liệu(PDF) 4 Page - Texas Instruments |
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LM723QML bảng dữ liệu(HTML) 4 Page - Texas Instruments |
4 / 23 page LM723QML SNVS310A – FEBRUARY 2005 – REVISED APRIL 2013 www.ti.com Absolute Maximum Ratings (1) Pulse Voltage from V+ to V− (50 ms) 50V Continuous Voltage from V+ to V− 40V Input-Output Voltage Differential 40V Maximum Amplifier Input Either Input 8.5V Voltage Differential 5V Current from VZ 25 mA Current from VREF 15 mA Internal Power Dissipation Metal Cavity DIP(2) 900 mW 800 mW Can(2) LCCC(2) 900 mW Operating Temperature Range −55°C ≤ TA ≤ +125°C Maximum TJ +150°C Storage Temperature Range −65°C ≤ TA ≤ +150°C Lead Temperature (Soldering, 4 sec. max.) 300°C Thermal Resistance θJA CDIP (Still Air) 100°C/W CDIP (500LF/ Min Air flow) 61°C/W Metal Can (Still Air) 156°C/W Metal Can (500LF/ Min Air flow) 89°C/W LCCC (Still Air) 96°C/W LCCC (500LF/ Min Air flow) 70°C/W θJC CDIP 22°C/W Metal Can 37°C/W LCCC 27°C/W ESD Tolerance(3) 500V (1) “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For specified specifications and test conditions, see the Electrical Characteristics. The specified specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) The maximum power dissipation for these devices must be derated at elevated temperatures and is dictated by TJMAX, θJA, and the ambient temperature, TA. The maximum available power dissipation at any temperature is Pd = (TJMAX − TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is less. See derating curves for maximum power rating above 25°C. (3) Human body model, 1.5 k Ω in series with 100 pF. Quality Conformance Inspection — MIL-STD-883, Method 5005 — Group A Subgroup Description Temp ( °C) 1 Static tests at +25 2 Static tests at +125 3 Static tests at -55 4 Dynamic tests at +25 5 Dynamic tests at +125 6 Dynamic tests at -55 7 Functional tests at +25 8A Functional tests at +125 8B Functional tests at -55 9 Switching tests at +25 10 Switching tests at +125 11 Switching tests at -55 4 Submit Documentation Feedback Copyright © 2005–2013, Texas Instruments Incorporated Product Folder Links: LM723QML |
Số phần tương tự - LM723QML_16 |
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Mô tả tương tự - LM723QML_16 |
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