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74ABTH162260DLG4 bảng dữ liệu(PDF) 5 Page - Texas Instruments |
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74ABTH162260DLG4 bảng dữ liệu(HTML) 5 Page - Texas Instruments |
5 / 12 page SN54ABTH162260, SN74ABTH162260 12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH SERIES-DAMPING RESISTORS AND 3-STATE OUTPUTS SCBS240D – JUNE 1992 – REVISED MAY 1997 5 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS TA = 25°C SN54ABTH162260 SN74ABTH162260 UNIT PARAMETER TEST CONDITIONS MIN TYP† MAX MIN MAX MIN MAX UNIT VIK VCC = 4.5 V, II = –18 mA –1.2 –1.2 –1.2 V VCC = 4.5 V, IOH = –3 mA 2.5 2.5 2.5 VOH VCC = 5 V, IOH = –3 mA 3 3 3 V VOH VCC =4 5V IOH = –24 mA 2 2 V VCC = 4.5 V IOH = –32 mA 2* 2 A port IOL = 48 mA 0.55 0.55 VOL A port VCC = 4.5 V IOL = 64 mA 0.55* 0.55 V B port IOL = 12 mA 0.8 0.8 0.8 Vhys 100 mV II Control inputs VCC = 0 to 5.5 V, VI = VCC or GND ±1 ±1 ±1 µA II A or B ports VCC = 2.1 V to 5.5 V, VI = VCC or GND ±20 ±20 ±20 µA II(h ld) AorB ports VCC =4 5V VI = 0.8 V 100 µA II(hold) A or B ports VCC = 4.5 V VI = 2 V –100 µA IOZPU‡ VCC = 0 to 2.1 V, VO = 0.5 V to 2.7 V, OE = X ±50 ±50 ±50 µA IOZPD‡ VCC = 2.1 V to 0, VO = 0.5 V to 2.7 V, OE = X ±50 ±50 ±50 µA IOZH§ VCC = 2.1 V to 5.5 V, VO = 2.7 V, OE ≥ 2 V 10 10 10 µA IOZL§ VCC = 2.1 V to 5.5 V, VO = 0.5 V, OE ≥ 2 V –10 –10 –10 µA Ioff VCC = 0, VI or VO ≤ 4.5 V ±100 ±100 µA ICEX Outputs high VCC = 5.5 V, VO = 5.5 V 50 50 50 µA IO¶ VCC = 5.5 V, VO = 2.5 V –50 –100 –225 –50 –225 –50 –225 mA Outputs high 1.5 1.5 1.5 ICC Outputs low VCC = 5.5 V, IO = 0, 63 63 63 mA ICC Outputs disabled VI = VCC or GND 1 1 1 mA ∆ICC# VCC = 5.5 V, One input at 3.4 V, Other inputs at VCC or GND 1 1.5 1 mA Ci VI = 2.5 V or 0.5 V 3 pF Co VO = 2.5 V or 0.5 V 11.5 pF * On products compliant to MIL-PRF-38535, this parameter does not apply. † All typical values are at VCC = 5 V. ‡ This parameter is characterized but not tested. § The parameters IOZH and IOZL include the input leakage current. ¶ Not more than one output should be tested at a time, and the duration of the test should not exceed one second. # This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND. PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice. |
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