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SN74ABT162823DL bảng dữ liệu(PDF) 5 Page - Texas Instruments |
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SN74ABT162823DL bảng dữ liệu(HTML) 5 Page - Texas Instruments |
5 / 9 page SN54ABT162823, SN74ABT162823 18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS SCBS473B – JUNE 1994 – REVISED JANUARY 1997 5 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 recommended operating conditions (see Note 3) SN54ABT162823 SN74ABT162823 UNIT MIN MAX MIN MAX UNIT VCC Supply voltage 4.5 5.5 4.5 5.5 V VIH High-level input voltage 2 2 V VIL Low-level input voltage 0.8 0.8 V VI Input voltage 0 VCC 0 VCC V IOH High-level output current –12 –12 mA IOL Low-level output current 12 12 mA ∆t/∆v Input transition rise or fall rate Outputs enabled 10 10 ns / V TA Operating free-air temperature –55 125 –40 85 °C NOTE 3: Unused inputs must be held high or low to prevent them from floating. electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS TA = 25°C SN54ABT162823 SN74ABT162823 UNIT PARAMETER TEST CONDITIONS MIN TYP† MAX MIN MAX MIN MAX UNIT VIK VCC = 4.5 V, II = –18 mA –1.2 –1.2 –1.2 V VCC = 4.5 V, IOH = – 1 mA 3.35 3.35 3.35 VOH VCC = 5 V, IOH = – 1 mA 3.85 3.85 3.85 V VOH VCC =4 5V IOH = – 3 mA 3.1 3.1 3.1 V VCC = 4.5 V IOH = – 12 mA 2.6* 2.6 VOL VCC =4 5V IOL = 8 mA 0.4 0.8 0.8 0.65 V VOL VCC = 4.5 V IOL = 12 mA 0.8 V Vhys 100 mV II VCC = 5.5 V, VI = VCC or GND ±1 ±1 ±1 µA IOZH VCC = 5.5 V, VO = 2.7 V 10 10 10 µA IOZL VCC = 5.5 V, VO = 0.5 V –10 –10 –10 µA Ioff VCC = 0, VI or VO ≤ 4.5 V ±100 ±100 µA ICEX VCC = 5.5 V, VO = 5.5 V Outputs high 50 50 50 µA IO‡ VCC = 5.5 V, VO = 2.5 V –25 –55 –100 –25 –100 –25 –100 mA V5 5 V I 0 Outputs high 2 2 2 ICC VCC = 5.5 V, IO = 0, VI =VCC or GND Outputs low 80 80 80 mA VI = VCC or GND Outputs disabled 2 2 2 ∆ICC§ VCC = 5.5 V, One input at 3.4 V, Other inputs at VCC or GND 1.5 1.5 1.5 mA Ci VI = 2.5 V or 0.5 V 3 pF Co VO = 2.5 V or 0.5 V 8 pF * On products compliant to MIL-PRF-38535, this parameter does not apply. † All typical values are at VCC = 5 V. ‡ Not more than one output should be tested at a time, and the duration of the test should not exceed one second. § This is the increase in supply current for each input that is at the specified TTL-voltage level rather than VCC or GND. PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice. |
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