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SN74ABT657ADBLE bảng dữ liệu(PDF) 6 Page - Texas Instruments |
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SN74ABT657ADBLE bảng dữ liệu(HTML) 6 Page - Texas Instruments |
6 / 13 page SN54ABT657A, SN74ABT657A OCTAL TRANSCEIVERS WITH PARITY GENERATORS/CHECKERS AND 3-STATE OUTPUTS SCBS192E – JANUARY 1991 – REVISED JUNE 1997 6 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS TA = 25°C SN54ABT657A SN74ABT657A UNIT PARAMETER TEST CONDITIONS MIN TYP† MAX MIN MAX MIN MAX UNIT VIK VCC = 4.5 V, II = –18 mA –1.2 –1.2 –1.2 V VCC = 4.5 V, IOH = –3 mA 2.5 2.5 2.5 VOH VCC = 5 V, IOH = –3 mA 3 3 3 V VOH VCC =4 5V IOH = –24 mA 2 2 V VCC = 4.5 V IOH = –32 mA 2* 2 VOL VCC =4 5V IOL = 48 mA 0.55 0.55 V VOL VCC = 4.5 V IOL = 64 mA 0.55* 0.55 V Vhys 100 mV II Control inputs VCC = 0 to 5.5 V, VI = VCC or GND ±1 ±1 ±1 µA II A or B ports VCC = 2.1 V to 5.5 V, VI = VCC or GND ±20 ±20 ±20 µA IOZPU‡ VCC = 0 to 2.1 V, VO = 0.5 V to 2.7 V, OE = X ±50 ±50 ±50 µA IOZPD‡ VCC = 2.1 V to 0, VO = 0.5 V to 2.7 V, OE = X ±50 ±50 ±50 µA IOZH§ VCC = 2.1 V to 5.5 V, VO = 2.7 V, OE ≥ 2 V 10 10 10 µA IOZL§ VCC = 2.1 V to 5.5 V, VO = 0.5 V, OE ≥ 2 V –10 –10 –10 µA Ioff VCC = 0, VI or VO ≤ 4.5 V ±100 ±100 µA ICEX VCC = 5.5 V, VO = 5.5 V Outputs high 50 50 50 µA IO¶ VCC = 5.5 V, VO = 2.5 V –50 –100 –200 –50 –200 –50 –200 mA VCC = 5.5 V, Outputs high 250 250 250 µA ICC VCC = 5.5 V, IO = 0, Outputs low 40 40 40 mA VI = VCC or GND Outputs disabled 250 250 250 µA Data inputs VCC = 5.5 V, One input at 3.4 V, Outputs enabled 1.5 1.5 1.5 ∆ICC# Data inputs , Other inputs at VCC or GND Outputs disabled 0.25 0.25 0.25 mA Control inputs VCC = 5.5 V, One input at 3.4 V, Other inputs at VCC or GND 1.5 1.5 1.5 Ci Control inputs VI = 2.5 V or 0.5 V 4 pF Cio A or B ports VO = 2.5 V or 0.5 V 10 pF * On products compliant to MIL-PRF-38535, this parameter does not apply. † All typical values are at VCC = 5 V. ‡ This parameter is characterized, but not production tested. § The parameters IOZH and IOZL include the input leakage current. ¶ Not more than one output should be tested at a time, and the duration of the test should not exceed one second. # This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND. PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice. |
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