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LM25010-Q1 bảng dữ liệu(PDF) 4 Page - Texas Instruments |
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LM25010-Q1 bảng dữ liệu(HTML) 4 Page - Texas Instruments |
4 / 31 page 4 LM25010, LM25010-Q1 SNVS419E – DECEMBER 2005 – REVISED MAY 2016 www.ti.com Product Folder Links: LM25010 LM25010-Q1 Submit Documentation Feedback Copyright © 2005–2016, Texas Instruments Incorporated (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Ratings. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) For detailed information on soldering plastic HTSSOP and WSON packages, see Mechanical, Packaging, and Orderable Information. 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT VIN to RTN –0.3 45 V BST to RTN –0.3 59 V SW to RTN (steady state) –1.5 V BST to VCC 45 V BST to SW 14 V VCC to RTN –0.3 14 V SGND to RTN –0.3 0.3 V SS to RTN –0.3 4 V VIN to SW 45 V All other inputs to RTN –0.3 7 V Lead temperature (soldering, 4 s)(2) 260 °C Junction temperature, TJ (LM25010, Q1,Q0) –40 150 °C Storage temperature, Tstg –65 150 °C (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.2 ESD Ratings: LM25010 VALUE UNIT V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2000 V Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±750 (1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification. (2) Level listed above is the passing level per ANSI/ESDA/JEDEC JS-001. JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process. (3) Level listed above is the passing level per EIA-JEDEC JESD22-C101. JEDEC document JEP157 states that 250 V CDM allows safe manufacturing with a standard ESD control process. 6.3 ESD Ratings: LM25010-Q1, LM25010-Q0 VALUE UNIT V(ESD) Electrostatic discharge Human-body model (HBM), per AEC Q100-002(1)(2) ±2000 V Charged-device model (CDM), per AEC Q100-011(3) ±750 6.4 Recommended Operating Ratings over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT VIN Input voltage 6 42 V IO Output current 1 A Ext-VCC External bias voltage 8 13 V TJ Junction temperature LM25010 –40 125 °C LM25010-Q1, LM25010-Q0 –40 150 °C |
Số phần tương tự - LM25010-Q1 |
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Mô tả tương tự - LM25010-Q1 |
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