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Giải thích chi tiết về linh kiện  SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
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SN74ABT8543 bảng dữ liệu(HTML) 1 Page - Texas Instruments

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SN54ABT8543, SN74ABT8543
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS120E – AUGUST 1991 – REVISED JULY 1996
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
D Members of the Texas Instruments
SCOPE
™ Family of Testability Products
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
D Functionally Equivalent to ’F543 and
’ABT543 in the Normal-Function Mode
D SCOPE ™ Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
– Parallel-Signature Analysis at Inputs
With Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Even-Parity Opcodes
D Two Boundary-Scan Cells Per I/O for
Greater Flexibility
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D Package Options Include Plastic
Small-Outline (DW) and Shrink
Small-Outline (DL) Packages, Ceramic Chip
Carriers (FK), and Standard Ceramic
DIPs (JT)
description
The ’ABT8543 scan test devices with octal
registered bus transceivers are members of the
Texas
Instruments
SCOPE
testability
integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary
scan to facilitate testing of complex circuit-board
assemblies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’F543 and ’ABT543 octal registered bus
transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at
the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not
affect the functional operation of the SCOPE
™ octal registered bus transceivers.
Copyright
© 1996, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE and EPIC-
ΙΙB are trademarks of Texas Instruments Incorporated.
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LEAB
CEAB
OEAB
A1
A2
A3
GND
A4
A5
A6
A7
A8
TDO
TMS
LEBA
CEBA
OEBA
B1
B2
B3
B4
VCC
B5
B6
B7
B8
TDI
TCK
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B7
B8
TDI
TCK
TMS
TDO
A8
OEBA
CEBA
LEBA
LEAB
CEAB
OEAB
A1
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SN54ABT8543 . . . JT PACKAGE
SN74ABT8543 . . . DL OR DW PACKAGE
(TOP VIEW)
SN54ABT8543 . . . FK PACKAGE
(TOP VIEW)


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