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ADS5203IPFBR bảng dữ liệu(PDF) 3 Page - Texas Instruments

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ADS5203
SBAS258A – JUNE 2002 – REVISED JULY 2002
www.ti.com
3
ELECTRICAL CHARACTERISTICS
over recommended operating conditions with fCLK = 80MHz and use of internal voltage references, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Power Supply
AVDD
AV
DV
DRV
3 3V
56
62
IDD Operating Supply Current
DVDD
AVDD = DVDD = DRVDD = 3.3V,
CL =10pFfIN = 3 5MHz –1dBFS
1.7
2.2
mA
IDD O erating Su ly Current
DRVDD
CL = 10pF, fIN = 3.5MHz, –1dBFS
15
26
mA
Power Dissipation
PD
PWDN_REF = ‘L’
240
290
mW
Power Dissipation
PD
PWDN_REF = ‘H’
220
240
mW
Standby Power
PD(STBY)
STDBY = ‘H’, CLK Held HIGH or LOW
95
150
µW
Power-Up Time for All References from Standby
tPD
550
ms
Wake Up Time
tWU
External Reference
40
µs
Digital Inputs
High-Level Input Current on Digital Inputs incl. CLK
IIH
AVDD =DVDD =DRVDD =36V
–1
1
µA
Low-Level Input Current on Digital Inputs incl. CLK
IIL
AVDD = DVDD = DRVDD = 3.6V
–1
1
µA
Digital Outputs
High-Level Output Voltage
VOH
AVDD = DVDD = DRVDD = 3.0V at
IOH = 50µA, Digital Outputs Forced HIGH
2.8
2.96
V
Low-Level Output Voltage
VOL
AVDD = DVDD = DRVDD = 3.0V at
IOL = 50µA, Digital Outputs Forced LOW
0.04
0.2
V
Output Capacitance
CO
5
pF
High-Impedance State Output Current to High-Level
IOZH
AVDD =DVDD =DRVDD =36V
–1
+1
µA
High-Impedance State Output Current to Low-Level
IOZL
AVDD = DVDD = DRVDD = 3.6V
–1
+1
µA
Data Output Rise and Fall Time
CLOAD = 10pF, Single–Bus Mode
3
ns
Data Output Rise-and-Fall Time
CLOAD = 10pF, Dual–Bus Mode
5
ns
Reference Outputs
Reference Top Voltage
VREFTO
Absolute Min/Max Values Valid and
1.9
2
2.1
V
Reference Bottom Voltage
VREFBO
Absolute Min/Max Values Valid and
Tested for AVDD = 3.3V
0.95
1
1.05
V
Differential Reference Votage
REFT – REFB
0.95
1.0
1.05
V
DC Accuracy
Integral Nonlinearity End Point
INL
Internal
TA = 40°C to +85°C
15
±04
+1 5
LSB
Integral Nonlinearity, End Point
INL
Internal
References(1)
TA = –40°C to +85°C
–1.5
±0.4
+1.5
LSB
Differential Nonlinearity
DNL
Internal
References(2)
TA = –40°C to +85°C
–0.9
±0.5
+1
LSB
Missing Codes
No Missing Codes Assured
Zero Error(3)
AV
DV
DRV
3 3V
0.12
±1.5
%FS
Full–Scale Error
AVDD = DVDD = DRVDD = 3.3V
External References (3)
0.28
±1.5
%FS
Gain Error
External References (3)
0.24
±1.5
%FS
(1) Integral nonlinearity refers to the deviation of each individual code from a line drawn from zero to full-scale. The point used as zero occurs ½LSB
before the first code transition. The full-scale point is defined as a level
½LSB beyond the last code transition. The deviation is measured from
the center of each particular code to the best-fit line between these two endpoints.
(2) An ideal ADC exhibits code transitions that are exactly 1LSB apart. DNL is the deviation from this ideal value. Therefore, this measure indicates
how uniform the transfer function step sizes are. The ideal step size is defined here as the step size for the device under test, (i.e., (last transition
level – first transition level)/(2n – 2)). Using this definition for DNL separates the effects of gain and offset error. A minimum DNL better than
–1LSB ensures no missing codes.
(3) Zero error is defined as the difference in analog input voltage—between the ideal voltage and the actual voltage—that will switch the ADC output
from code 0 to code 1. The ideal voltage level is determined by adding the voltage corresponding to
½LSB to the bottom reference level. The
voltage corresponding to 1LSB is found from the difference of top and bottom references divided by the number of ADC output levels (1024).
Full-scale error is defined as the difference in analog input voltage—between the ideal voltage and the actual voltage—that will switch the ADC
output from code 1022 to code 1023. The ideal voltage level is determined by subtracting the voltage corresponding to 1.5LSB from the top
reference level. The voltage corresponding to 1LSB is found from the difference of top and bottom references divided by the number of ADC
output levels (1024).


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