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BurrBrown Products
from Texas Instruments
FEATURES
APPLICATIONS
DESCRIPTION
DAC8830-EP
DAC8831-EP
SGLS334C – AUGUST 2006 – REVISED APRIL 2007
16-Bit, Ultra-Low Power, Voltage-Output
Digital-to-Analog Converters
• Portable Equipment
• Controlled Baseline
• Automatic Test Equipment
One Assembly
• Industrial Process Control
One Test Site
• Data Acquisition Systems
One Fabrication Site
• Optical Networking
• Extended Temperature Performance of –55°C
to 125
°C
• Enhanced Diminishing Manufacturing Sources
The DAC8830 and DAC8831 are single, 16-bit,
(DMS) Support
serial-input,
voltage-output
digital-to-analog
• Enhanced Product-Change Notification
converters (DACs) operating from a single 3-V to 5-V
• Qualification Pedigree (1)
power supply. These converters provide excellent
linearity, low glitch, low noise, and fast settling over
• 16-Bit Resolution
the specified temperature range of –55
°C to 125°C.
• 2.7-V to 5.5-V Single-Supply Operation
The output is unbuffered, which reduces the power
• Low Power: 15 μW for 3-V Power
consumption and the error introduced by the buffer.
• High Accuracy, INL: 1 LSB
These parts feature a standard high-speed (clock up
• Low Glitch: 8 nV-s
to 50 MHz), 3-V or 5-V SPI serial interface to
communicate with the DSP or microprocessors.
• Low Noise: 10 nV/√Hz
• Fast Settling: 1 μs
The DAC8830 output is 0 V to VREF. However, the
DAC8831 provides bipolar mode output (
±V
REF)
• Fast SPI Interface Up to 50 MHz
when working with an external buffer. The DAC8830
• Reset to Zero-Code
and DAC8831 are both reset to zero-code after
• Schmitt-Trigger Inputs for Direct Optocoupler
power up.
Interface
For
optimum
performance,
a
set
of
Kelvin
• Industry-Standard Pin Configuration
connections to external reference and analog ground
input are provided on the DAC8831.
(1)
Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
The DAC8830 is available in an SO-8 package and
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
the DAC8831 is available in an SO-14 package. Both
temperature cycle, autoclave or unbiased HAST,
have industry standard pinouts (see Table 3, the
electromigration, bond intermetallic life, and mold compound
Cross Reference table in the Application Information
life. Such qualification testing should not be viewed as
section for details).
justifying use of this component beyond specified
performance and environmental limits.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2006–2007, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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