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DAC8830MCD bảng dữ liệu(PDF) 3 Page - Texas Instruments |
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DAC8830MCD bảng dữ liệu(HTML) 3 Page - Texas Instruments |
3 / 32 page www.ti.com ABSOLUTE MAXIMUM RATINGS DAC8830-EP DAC8831-EP SGLS334C – AUGUST 2006 – REVISED APRIL 2007 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION(1) MINIMUM POWER- RELATIVE DIFFERENTIAL ON SPECIFICATION TRANSPORT ACCURACY NONLINEARITY RESET TEMPERATURE PACKAGE PACKAGE- PACKAGE (2) ORDERING MEDIA, PRODUCT (LSB) (LSB) VALUE RANGE MARKING LEAD DESIGNATOR NUMBER QUANTITY Tape and Reel, DAC8830MCDREP 2500 DAC8830MCD ±1 ±1 Zero-Code –55 °C to 125°C 8830M SO-8 D DAC8830MCDEP Tube, 75 Tape and Reel, DAC8831MCDREP 2500 DAC8831MCD ±1 ±1 Zero-Code –55 °C to 125°C 8831M SO-14 D DAC8831MCDEP Tube, 50 (1) For the most current package and ordering information, see the Package Option Addendum at the end of this data sheet, or see the Texas Instruments website at www.ti.com. (2) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package. over operating free-air temperature range (unless otherwise noted) (1) VALUE UNIT VDD to AGND –0.3 to 7 V Digital input voltage to DGND –0.3 to VDD + 0.3 V VOUT to AGND –0.3 to VDD + 0.3 V AGND, AGNDF, AGNDS to DGND –0.3 to 0.3 V Operating temperature range –55 to 125 °C Storage temperature range –65 to 150 °C Junction temperature range (TJ max) 150 °C Power dissipation (TJ max – TA)/ θJA W SO-8 149.5 °C/W Thermal impedance, θJA SO-14 104.5 °C/W Vapor phase (60 s) 215 °C Lead temperature, soldering Infrared (15 s) 220 °C (1) Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute maximum conditions for extended periods may affect device reliability. 3 Submit Documentation Feedback |
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