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ADS8506IBDW bảng dữ liệu(PDF) 3 Page - Texas Instruments |
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ADS8506IBDW bảng dữ liệu(HTML) 3 Page - Texas Instruments |
3 / 35 page www.ti.com ADS8506 SLAS484B – SEPTEMBER 2007 – REVISED DECEMBER 2007 ELECTRICAL CHARACTERISTICS (continued) At TA = -40°C to 85°C, fS = 40 kHz, VDIG = VANA = 5 V, and using internal reference and fixed resistors, (see Figure 43) unless otherwise specified. ADS8506IB ADS8506I PARAMETER TEST CONDITIONS UNIT MIN TYP MAX MIN TYP MAX DNL Differential linearity error -0.45 ±0.15 0.45 -0.9 ±0.15 0.9 LSB No missing codes 12 12 Bits Transition noise(2) 0.1 0.1 LSB Gain Error ±0.1 ±0.2 % Full scale error(3)(4) -0.25 0.25 -0.5 0.5 % Full scale error drift ±5 ±7 ppm/ °C Full scale error(3)(4) Ext. 2.5-V Ref -0.25 0.25 -0.5 0.5 % Full scale error drift Ext. 2.5-V Ref ±0.5 ±0.5 ppm/ °C Bipolar zero error(3) ±10 V Range -10 10 -10 10 mV Bipolar zero error drift ±10 V Range ±0.5 ±0.5 ppm/ °C Unipolar zero error(3) 0 V to 5 V, 0 V to 4 V Ranges -3 3 -3 3 mV Unipolar zero error drift 0 V to 5 V, 0 V to 4 V Ranges ±0.5 ±0.5 ppm/ °C Recovery time to rated accuracy 1 2.2- µF Capacitor to CAP 1 ms from power down(5) Power supply sensitivity +4.75 V < VS < +5.25 V ±0.5 ±0.5 LSB (VDIG = VANA = VS) AC ACCURACY SFDR Spurious-free dynamic range fIN = 10 kHz, ±10 V 80 98 80 98 dB(6) THD Total harmonic distortion fIN = 10 kHz, ±10 V -96 -80 -96 -80 dB fIN = 10 kHz, ±10 V 72 73.9 70 73.9 SINAD Signal-to-(noise+distortion) dB -60 dB Input 32 32 SNR Signal-to-noise 72 74 70 74 dB Usable bandwidth(7) fIN = 10 kHz, ±10 V 130 130 kHz Full-power bandwidth (-3 dB) 600 600 kHz SAMPLING DYNAMICS Aperture delay 40 40 ns Aperture jitter 20 20 ps Transient response FS Step 5 5 µs Overvoltage recovery(8) 750 750 ns REFERENCE Internal reference voltage No load 2.48 2.5 2.52 2.48 2.5 2.52 V Internal reference source current 1 1 µA (must use external buffer) Internal reference drift 8 8 ppm/ °C External reference voltage range 2.3 2.5 2.7 2.3 2.5 2.7 V for specified linearity External reference current drain Ext. 2.5-V Ref 100 100 µA DIGITAL INPUTS VIL Low-level input voltage -0.3 +0.8 -0.3 +0.8 V VIH High-level input voltage 2.0 VD +0.3 V 2.0 VD +0.3 V V IIL Low-level input current VIL = 0 V ±10 ±10 µA IIH High-level input current VIH = 5 V ±10 ±10 µA DIGITAL OUTPUTS (2) Typical rms noise at worst case transitions. (3) As measured with fixed resistors, see Figure 43. Adjustable to zero with external potentiometer. (4) Full scale error is the worst case of -Full Scale or +Full Scale untrimmed deviation from ideal first and last code transitions, divided by the transition voltage (not divided by the full-scale range) and includes the effect of offset error. (5) This is the time delay after the ADS8506 is brought out of Power-Down mode until all internal settling occurs and the analog input is acquired to rated accuracy. A Convert command after this delay will yield accurate results. (6) All specifications in dB are referred to a full-scale input. (7) Usable bandwidth defined as full-scale input frequency at which Signal-to-(Noise + Distortion) degrades to 60 dB. (8) Recovers to specified performance after 2 x FS input overvoltage. Copyright © 2007, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Link(s): ADS8506 |
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