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ADC0800 bảng dữ liệu(PDF) 9 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
tên linh kiện ADC0800
Giải thích chi tiết về linh kiện  ADC0800 8-Bit A/D Converter
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Typical Applications (Continued)
A low speed ramp generator can also be used to sweep the
analog input voltage and the LED outputs will provide a bi-
nary counting sequence from zero to full-scale
The techniques described so far are suitable for an engi-
neering evaluation or a quick check on performance For a
higher speed test system or to obtain plotted data a digital-
to-analog converter is needed for the test set-up An accu-
rate 10-bit DAC can serve as the precision voltage source
for the AD Errors of the AD under test can be provided as
either analog voltages or differences in two digital words
A basic AD tester which uses a DAC and provides the error
as an analog output voltage is shown in
Figure 6 The2op
amps can be eliminated if a lab DVM with a numerical sub-
traction feature is available to directly readout the difference
voltage ‘‘A – C’’
For operation with a microprocessor or a computer-based
test system it is more convenient to present the errors digi-
tally This can be done with the circuit of
Figure 7 where the
output code transitions can be detected as the 10-bit DAC is
incremented This provides
LSB steps for the 8-bit AD
under test If the results of this test are automatically plotted
with the analog input on the X axis and the error (in LSB’s)
as the Y axis a useful transfer function of the AD under
test results For acceptance testing the plot is not neces-
sary and the testing speed can be increased by establishing
internal limits on the allowed error for each code
All R’se005% tolerance
TLH5670 – 16
FIGURE 6 AD Tester with Analog Error Output
TLH5670 – 17
FIGURE 7 Basic ‘‘Digital’’ AD Tester
Connection Diagram
Dual-In-Line Package
TLH5670 – 9
Top View
Order Number ADC0800PD
or ADC0800PCD
See NS Package Number D18A
9


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