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TS6001AIG325 bảng dữ liệu(PDF) 3 Page - Silicon Laboratories |
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TS6001AIG325 bảng dữ liệu(HTML) 3 Page - Silicon Laboratories |
3 / 13 page TS6001 TS6001 Rev. 1.0 Page 3 ELECTRICAL CHARACTERISTICS VIN = +5V, IOUT = 0, TA = TMIN to TMAX, unless otherwise noted. Typical values are at TA = +25°C. See Note 1. PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS OUTPUT Output Voltage VOUT TA = +25°C TS6001A 2.498 2.500 2.502 V -0.08 0.08 % TS6001B 2.496 2.500 2.504 V -0.16 0.16 % Output Voltage Temperature Coefficient (See Note 2) TCVOUT 0°C ≤ T A ≤ +85°C TS6001A 2 7 ppm/°C -40°C ≤ T A ≤ +85°C 2.5 10 0°C ≤ T A ≤ +85°C TS6001B 3 10 -40°C ≤ T A ≤ +85°C 4 15 Line Regulation ( ∆V OUT/VOUT) / ∆V IN (VOUT + 0.2V) ≤ VIN ≤ 12.6V 10 30 ppm/V Load Regulation ( ∆V OUT/VOUT) / ∆I OUT Sourcing 0 ≤ I OUT ≤ 500μA 30 240 ppm/mA Sinking -500 μA ≤ I OUT ≤ 0 70 320 Dropout Voltage (See Note 3) VIN -VOUT IOUT = 500μA 75 150 mV OUT Short-Circuit Current ISC VOUT Short to GND 4 mA VOUT Short to IN 4 Temperature Hysteresis (See Note 4) 100 ppm Long-Term Stability (See Note 5) ∆V OUT/ time 168hr at TA = +25°C 75 ppm/ 168hr DYNAMIC Noise Voltage eOUT f = 0.1Hz to 10Hz 50 μV P-P f = 10Hz to 10kHz 75 μV RMS Ripple Rejection ∆V OUT/ ∆VIN VIN = 5V ±100mV, f = 120Hz 82 dB Turn-On Settling Time tR To VOUT = 0.1% of final value, COUT = 50 pF 340 μs Capacitive-Load Stability Range COUT See Note 6 0 2200 pF INPUT Supply Voltage Range VIN Guaranteed by line-regulation test VOUT + 0.2 12.6 V Quiescent Supply Current IIN 31 35 μA Change in Supply Current IIN/VIN (VOUT + 0.2V) ≤ VIN ≤ 12.6V 0.1 2 μA/V Note 1: All devices are 100% production tested at TA = +25°C and are guaranteed by characterization for TA = TMIN to TMAX, as specified. Note 2: Temperature Coefficient is measured by the “box” method; i.e., the maximum ∆V OUT is divided by the maximum ∆T. Note 3: Dropout voltage is the minimum input voltage at which VOUT changes ≤0.2% from VOUT at VIN = 5.0V. Note 4: Temperature hysteresis is defined as the change in the +25°C output voltage before and after cycling the device from +25°C to TMIN to +25°C and from +25°C to TMAX to +25°C. Note 5: Reference long-term drift or stability listed in the table is an intermediate result of a 1000-hour evaluation. Soldered onto a printed circuit board (pcb), voltage references exhibit more drift early in the evaluation because of assembly-induced differential stresses between the package and the pcb. Note 6: Not production tested; guaranteed by design. |
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