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LM7332MMX bảng dữ liệu(PDF) 6 Page - Texas Instruments |
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LM7332MMX bảng dữ liệu(HTML) 6 Page - Texas Instruments |
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6 / 34 page  LM7332 SNOSAV4B – APRIL 2008 – REVISED JANUARY 2016 www.ti.com 5-V Electrical Characteristics (continued) Unless otherwise specified, all limits are ensured for TA = 25°C, V + = 5 V, V− = 0 V, V CM = 0.5 V, VO = 2.5 V, and RL > 1 MΩ to 2.5 V. (1) PARAMETER TEST CONDITIONS MIN (2) TYP (3) MAX (2) UNIT GBWP Gain bandwidth product f = 50 kHz 19.3 MHz en Input-referred voltage noise f = 2 kHz 14.8 nV/ √HZ in Input-referred current noise f = 2 kHz 1.35 pA/ √HZ AV = +2, RL = 100 kΩ, f = 1 kHz, THD+N Total harmonic distortion + noise −84 dB VO = 4 VPP CT Rej. Crosstalk rejection f = 3 MHz, Driver RL = 10 kΩ 68 dB 6.6 ±5-V Electrical Characteristics Unless otherwise specified, all limits are ensured for TA = 25°C, V + = +5 V, V− = −5 V, V CM = 0 V, VO = 0 V, and RL > 1 MΩ to 0 V. (1) PARAMETER TEST CONDITIONS MIN (2) TYP (3) MAX (2) UNIT VCM = −4.5 V and VCM = 4.5 V −4 ±1.6 4 VOS Input offset voltage mV At the temperature extremes −5 5 Input offset voltage temperature TC VOS VCM = −4.5 V and VCM = 4.5 V (4) ±2 µV/°C drift See (5) −2 ±1 2 IB Input bias current µA At the temperature extremes −2.5 2.5 20 250 IOS Input offset current nA At the temperature extremes 300 −5 V ≤ VCM ≤ 3 V 74 88 At the temperature extremes 75 CMRR Common-mode rejection ratio dB −5 V ≤ VCM ≤ 5 V 70 74 At the temperature extremes 65 5 V ≤ V+ ≤ 30 V, VCM = −4.5 V 78 100 PSRR Power supply rejection ration dB At the temperature extremes 74 CMRR > 50 dB 5.1 –5.3 –5.1 Input common-mode voltage CMVR V range At the temperature extremes 5 5.3 –5.1 −4 V ≤ VO ≤ 4 V 72 80 RL = 10 kΩ to 0 V AVOL Large signal voltage gain dB At the temperature extremes 70 (1) Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. (2) All limits are ensured by testing or statistical analysis. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production material. (4) Offset voltage temperature drift determined by dividing the change in VOS at temperature extremes into the total temperature change. (5) Positive current corresponds to current flowing in the device. 6 Submit Documentation Feedback Copyright © 2008–2016, Texas Instruments Incorporated Product Folder Links: LM7332 |
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