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LM7321MA bảng dữ liệu(PDF) 8 Page - Texas Instruments

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Giải thích chi tiết về linh kiện  Unlimited Capacitive Load Operational Amplifier
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LM7321, LM7322
SNOSAW8E – MAY 2008 – REVISED SEPTEMBER 2015
www.ti.com
±5-V Electrical Characteristics (continued)
Unless otherwise specified, all limited ensured for TA = 25°C, V
+ = 5 V, V= −5V, V
CM = 0 V, VOUT = 0 V, and RL > 1 MΩ to 0
V.
(1)
PARAMETER
TEST CONDITION
MIN(2)
TYP(3)
MAX(2)
UNIT
1.0
1.3
LM7321
TA = –40°C to
2
+125°C
IS
Supply Current
VCM = −4.5 V
mA
2.3
2.8
LM7322
TA = –40°C to
3.8
+125°C
SR
Slew Rate(7)
AV = +1, VI = 8-V Step
12.3
V/µs
fu
Unity Gain Frequency
RL = 2 kΩ, CL = 20 pF
9
MHz
GBW
Gain Bandwidth
f = 50 kHz
16
MHz
Input Referred Voltage
f = 2 kHz
en
14.3
nV/
√H
Noise Density
Input Referred Current
f = 2 kHz
in
1.35
pA/
√H
Noise Density
Total Harmonic
f = 1 kHz, RL = 100 kΩ, AV = +2
THD+N
−79
dB
Distortion + Noise
VOUT = 8 VPP
CT Rej.
Crosstalk Rejection
f = 100 kHz, Driver RL = 10 kΩ
60
dB
(7)
Slew rate is the slower of the rising and falling slew rates. Connected as a Voltage Follower.
7.7
±15-V Electrical Characteristics
Unless otherwise specified, all limited ensured for TA = 25°C, V
+ = 15 V, V= −15 V, V
CM = 0 V, VOUT = 0 V, and RL > 1 MΩ to
15 V.
(1)
PARAMETER
TEST CONDITION
MIN(2)
TYP(3)
MAX(2)
UNIT
−6
±0.7
+6
VCM = −14.5 V and
VOS
Input Offset Voltage
mV
VCM = 14.5 V
–40°C to +125°C
−8
+8
Input Offset Voltage
TC VOS
VCM = −14.5 V and VCM = 14.5 V
(4)
±2
µV/°C
Temperature Drift
−2
−1.1
VCM = −14.5 V
(5)
–40°C to +125°C
−2.5
IB
Input Bias Current
µA
0.45
1
VCM = 14.5 V
(5)
–40°C to +125°C
1.5
30
300
VCM = −14.5 V and
IOS
Input Offset Current
nA
VCM = 14.5 V
–40°C to +125°C
500
80
100
−15 V ≤ VCM ≤ 12 V
–40°C to +125°C
75
Common-Mode Rejection
CMRR
dB
Ratio
72
80
−15 V ≤ VCM ≤ 15 V
–40°C to +125°C
70
78
100
Power Supply Rejection
2.7 V
≤ VS ≤ 30 V, VCM
PSRR
dB
Ratio
=
−14.5 V
–40°C to +125°C
74
(1)
Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where TJ > TA.
(2)
All limits are ensured by testing or statistical analysis.
(3)
Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4)
Offset voltage temperature drift determined by dividing the change in VOS at temperature extremes into the total temperature change.
(5)
Positive current corresponds to current flowing into the device.
8
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Copyright © 2008–2015, Texas Instruments Incorporated
Product Folder Links: LM7321 LM7322


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