công cụ tìm kiếm bảng dữ liệu linh kiện điện tử |
|
LM117JAN bảng dữ liệu(PDF) 3 Page - Texas Instruments |
|
LM117JAN bảng dữ liệu(HTML) 3 Page - Texas Instruments |
3 / 24 page LM117JAN www.ti.com SNVS365A – MARCH 2006 – REVISED MARCH 2013 These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Absolute Maximum Ratings (1) Power Dissipation (2) Internally Limited Input-Output Voltage Differential +40V, −0.3V Storage Temperature −65°C ≤ TA ≤ +150°C Maximum Junction Temperature (TJmax) +150°C Lead Temperature Metal Package 300°C Thermal Resistance θJA TO–3 Still Air 39°C/W TO–3 500LF/Min Air flow 14°C/W TO Still Air 186°C/W TO 500LF/Min Air flow 64°C/W θJC TO–3 1.9°C/W TO Metal Can 21°C/W ESD Tolerance (3) 3KV (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature), θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower. "Although power dissipation is internally limited, these specifications are applicable for power dissipations of 2W for the TO package and 20W for the TO- 3 package." (3) Human body model, 100 pF discharged through a 1.5 k Ω resistor. Recommended Operating Conditions Operating Temperature Range −55°C ≤ TA ≤ +125°C Input Voltage Range 4.25V to 41.25V Quality Conformance Inspection MIL-STD-883, Method 5005 - Group A Subgroup Description Temp °C 1 Static tests at 25 2 Static tests at 125 3 Static tests at -55 4 Dynamic tests at 25 5 Dynamic tests at 125 6 Dynamic tests at -55 7 Functional tests at 25 8A Functional tests at 125 8B Functional tests at -55 9 Switching tests at 25 10 Switching tests at 125 11 Switching tests at -55 12 Settling time at 25 13 Settling time at 125 14 Settling time at -55 Copyright © 2006–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LM117JAN |
Số phần tương tự - LM117JAN_15 |
|
Mô tả tương tự - LM117JAN_15 |
|
|
Link URL |
Chính sách bảo mật |
ALLDATASHEET.VN |
Cho đến nay ALLDATASHEET có giúp ích cho doanh nghiệp của bạn hay không? [ DONATE ] |
Alldatasheet là | Quảng cáo | Liên lạc với chúng tôi | Chính sách bảo mật | Trao đổi link | Tìm kiếm theo nhà sản xuất All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |