công cụ tìm kiếm bảng dữ liệu linh kiện điện tử |
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LM140JAN-SP bảng dữ liệu(PDF) 2 Page - Texas Instruments |
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LM140JAN-SP bảng dữ liệu(HTML) 2 Page - Texas Instruments |
2 / 12 page LM140JAN SNVS399A – FEBRUARY 2006 – REVISED MARCH 2013 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Absolute Maximum Ratings (1) DC Input Voltage 35V Internal Power Dissipation (2) Internally Limited Maximum Junction Temperature (TJmax) 150°C Storage Temperature Range -65°C ≤ TA ≤ +150°C Operating Temperature Range -55°C ≤ TA ≤ +125°C Lead Temperature (Soldering 10 seconds) 300°C Thermal Resistance θJA T0 −5 (Still Air) 232°C/W T0 −5 (500 LF/Min Air Flow) 77°C/W T0 −3 (Still Air) 35°C/W T0 −3 (500 LF/Min Air Flow) TBD θJC T0 −5 15°C/W T0 −3 4°C/W ESD Susceptibility (3) 2KV (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature), θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower. (3) Human body model, 100pF discharged through 1.5K Ω Quality Conformance Inspection MIL-Std-883, Method 5005 - Group A Subgroup Description Temp °C 1 Static tests at 25 2 Static tests at 125 3 Static tests at -55 4 Dynamic tests at 25 5 Dynamic tests at 125 6 Dynamic tests at -55 7 Functional tests at 25 8A Functional tests at 125 8B Functional tests at -55 9 Switching tests at 25 10 Switching tests at 125 11 Switching tests at -55 12 Settling time at 25 13 Settling time at 125 14 Settling time at -55 2 Submit Documentation Feedback Copyright © 2006–2013, Texas Instruments Incorporated Product Folder Links: LM140JAN |
Số phần tương tự - LM140JAN-SP_15 |
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Mô tả tương tự - LM140JAN-SP_15 |
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