BAT720

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© NXP B.V. 2012. All rights reserved.

Product data sheet

Rev. 4 — 14 November 2012

4 of 10

NXP Semiconductors

BAT720

Schottky barrier diode

8.

Test information

8.1 Quality information

This product has been qualified in accordance with the Automotive Electronics Council

(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is

suitable for use in automotive applications.

Fig 3.

Diode capacitance as a function of reverse voltage; typical values

mbk577

40

30

(pF)

010

20

10

1