7-1331

Specifications CD40106BMS

Group B

Subgroup B-5

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample 5005

1, 7, 9

Group D

Sample 5005

1, 2, 3, 8A, 8B, 9

Subgroups 1, 2 3

NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE GROUPS

MIL-STD-883

METHOD

TEST

READ AND RECORD

PRE-IRRAD

POST-IRRAD

PRE-IRRAD

POST-IRRAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4

TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS

FUNCTION

OPEN

GROUND

VDD

9V

± -0.5V

OSCILLATOR

50kHz

25kHz

Static Burn-In 1

Note 1

2, 4, 6, 8, 10, 12

1, 3, 5, 7, 9, 11, 13

14

Static Burn-In 2

Note 1

2, 4, 6, 8, 10, 12

7

1, 3, 5, 9, 11,

13, 14

Dynamic Burn-

In Note 1

-

7

14

2, 4, 6, 8, 10, 12

1, 3, 5, 9, 11, 13

Irradiation

Note 2

2, 4, 6, 8, 10, 12

7

1, 3, 5, 9, 11,

13, 14

NOTES:

1. Each pin except VDD and GND will have a series resistor of 10K

± 5%, VDD = 18V ± 0.5V

2. Each pin except VDD and GND will have a series resistor of 47K

± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,

VDD = 10V

± 0.5V

Typical Performance Characteristics

FIGURE 2. TYPICAL OUTPUT LOW (SINK) CURRENT

CHARACTERISTICS

FIGURE 3. MINIMUM OUTPUT LOW (SINK) CURRENT

CHARACTERISTICS

TABLE 6. APPLICABLE SUBGROUPS

CONFORMANCE GROUP

MIL-STD-883

METHOD

GROUP A SUBGROUPS

READ AND RECORD

10V

5V

GATE-TO-SOURCE VOLTAGE (VGS) = 15V

0

5

10

15

15

10

5

20

25

30

DRAIN-TO-SOURCE VOLTAGE (VDS) (V)

10V

5V

GATE-TO-SOURCE VOLTAGE (VGS) = 15V

0

5

10

15

7.5

5.0

2.5

10.0

12.5

15.0

DRAIN-TO-SOURCE VOLTAGE (VDS) (V)