MCH18

Ceramic capacitors

CN (R) (B) (X7R)

FN (F) (Y5V)

−55°C ~ +125°C

−30°C ~ +85°C

Class 2 (High dielectric constant)

Temperature characteristics

Item

Operating temperature

Nominal capacitance (C)

Dissipation factor (tan

δ)

Insulation resistance (IR)

Withstanding voltage

Temperature characteristics

Terminal adherence

Resistance

to vibration

Appearance

Rate of capacitance change

Dissipation factor (tan

δ)

Solderability

Resistance

to soldering

heat

Appearance

Rate of capacitance change

Dissipation factor (tan

δ)

Insulation resistance

Withstanding voltage

Temperature

cycling

Appearance

Rate of capacitance change

Dissipation factor (tan

δ)

Insulation resistance

Humidity load

test

Appearance

Rate of capacitance change

Dissipation factor (tan

δ)

Insulation resistance

High-

temperature

load test

Appearance

Rate of capacitance change

Dissipation factor (tan

δ)

Insulation resistance

Must be within the specified tolerance range.

2.5% or less

(when rated voltage is 16V: 3.5% or less)

5.0% or less

(when rated voltage is 16V: 7.5% or less)

10,000 M

Ω or 500 MΩ ⋅ µF, whichever is smaller

The insulation must not be damaged.

Within

± 15%

+ 22, + 82%

No detachment or signs of detachment

There must be no mechanical damage.

Must be within initial tolerance.

Must satisfy initial specified value.

At least 3/4 of the surface of the two terminals must be covered with new solder.

There must be no mechanical damage.

Within

± 5.0%

Within

± 20.0%

Must satisfy initial specified value.

10,000M

Ω or 500MΩ ⋅ µF, whichever is smaller

The insulation must not be damaged.

There must be no mechanical damage.

Within

± 7.5%

Within

± 20.0%

Must satisfy initial specified value.

10,000M

Ω or 500MΩ ⋅ µF, whichever is smaller

There must be no mechanical damage.

± 12.5% or less

Within

± 30.0%

5.0% or less

7.5% or less

(when rated voltage is 16V: 10.0%)

500M

Ω or 25MΩ ⋅ µF, whichever is smaller

There must be no mechanical damage.

Within

± 10.0%

Within

± 30.0%

5.0% or less

7.5% or less

(when rated voltage is 16V: 10.0%)

1,000M

Ω or 50MΩ ⋅ µF, whichever is smaller

Test methods/conditions

(based on JIS C 5102)

Based on paragraph 7.8

Measured at room temperature and standard humidity,

Measurement frequency

Measurement voltage

Based on paragraph 7.6

Measurement is made after rated voltage

is applied for 60

± 5s.

Based on paragraph 7.1

Apply 250% of the rated voltage for 1 to 5s then measure.

The temperature coefficients in paragraph 7.12,

table 8, condition B, are based on measurements

carried out at 20

°C, with no voltage applied.

Based on paragraph 8. 11. 2.

Apply 5N for 10

± 1s

in the direction indicated

by the arrow.

Capacitor

Test board

Pressure (5N)

Chip is mounted to a board in the

manner shown on the right, subjected

to vibration (type A in paragraph 8.2),

and measured 48

± 4 hrs. later.

Board

Soldering temperature

Based on paragraph 8. 13

Soldering time

Based on paragraph 8. 14.

Soldering temperature

Soldering time

Preheating

Based on paragraph 9.3

Number of cycles : 5

Capacitance measured after 48

± 4 hrs.

Test temperature

Based on paragraph 9.9

Relative humidity

Applied voltage

Test time

Capacitance measured after 48

± 4 hrs.

Applied voltage

Test time

Capacitance measured after 48

± 4 hrs.

Test temperature

Based on paragraph 9.10

: 1

± 0.1 kHz

: 1.0

± 0.2 Vrms.

: 235

± 5°C

: 2

± 0.5s

: 260

± 5°C

: 5

± 0.5s

: 150

± 10°C for

1 to 2 min.

: 40

± 2°C

: 90% to 95%

: rated voltage

: 500 to 524 hrs.

: Max. operating temp.

: rated voltage

× 200%

: 1,000 to 1,048 hrs.

∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.