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4 / 9 page Multilayer Chip Varistor for Surge and ESD Protection – E Type Series Document No TMVE-XXOS001C Issued date 2012/02/13 Page 4/9 TA-I TECHNOLOGY CO., LTD 6. Reliability Test Environmental Specification Test Method and Description High Temperature Storage/ Dry Heat The specimen shall be subjected to 150 ± 2℃ for 1000 ± 12 hours in a thermostatic bath without load and then stored at room temperature and humidity for 1 to 2 hours. Therefore, the change of varistor voltage shall be measured. Temperature Cycle The temperature cycle of specified temperature shall be repeated five times and then stored at room temperature and humidity for one or two hours. The change of varistor voltage and mechanical damage shall be examined. Step Temperature Period 1 -40±3 30Min±3 2 Room Temperature 1 hour 3 125±3 30Min±3 4 Room Temperature 1 hours High Temperature Load After being continuously applied the maximum allowable voltage at 85 ± 2℃ for 1000± 2 hours, the specimen shall be stored at room temperature and humidity for one or two hours, Therefore the change of varistor voltage should be measured. Dry Heat Load Damp Heat Load/ The specimen should be subjected to 40± 2℃, 90 to 95﹪ RH and the maximum allowable voltage for 500 hours and then stored at room temperature and humidity for one or two hours. Therefore the change of varistor voltage should be measured. Humidity Load Low Temperature Storage/ Cold The specimen should be subjected to -50 ± 2℃, without load for 500 hours and then stored at room temperature for one or two hours. Therefore the change of varistor voltage should be measured. Direct contact electrostatic discharge 1.Discharge: contact electrostatic discharge; 2.Voltage:8KV(Level4) 3.Polarity:+,- ; 4.Number: 10 times ; 5.Interval time:1sec Direct air electrostatic discharge 1.Discharge: air electrostatic discharge; 2.Voltage:15KV(Level4) 3.Polarity:+,-; 4.Number: 10 times; 5.Interval time:1~ 3sec |
Số phần tương tự - MV06E050T050- |
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Mô tả tương tự - MV06E050T050- |
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