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MC33662LEF bảng dữ liệu(PDF) 5 Page - Freescale Semiconductor, Inc

tên linh kiện MC33662LEF
Giải thích chi tiết về linh kiện  LIN 2.1 / SAEJ2602-2, LIN Physical Layer
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nhà sản xuất  FREESCALE [Freescale Semiconductor, Inc]
Trang chủ  http://www.freescale.com
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MC33662LEF bảng dữ liệu(HTML) 5 Page - Freescale Semiconductor, Inc

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Analog Integrated Circuit Device Data
Freescale Semiconductor
5
33662
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 3. Maximum Ratings
All voltages are with respect to ground, unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Ratings
Symbol
Value
Unit
ELECTRICAL RATINGS
Power Supply Voltage
Normal Operation (DC)
Transient input voltage with external component (according to ISO7637-2 & ISO7637-
3 & “Hardware Requirements for LIN, CAN and Flexray Interfaces in Automotive
Applications” specification Rev1.1 / December 2nd, 2009) (See Table 4 and Figure 4)
- Pulse 1 (test up to the limit for Damage - Class A(2))
- Pulse 2a (test up to the limit for Damage - Class A(2))
- Pulse 3a (test up to the limit for Damage - Class A(2))
- Pulse 3b (test up to the limit for Damage - Class A(2))
- Pulse 5b (Class A)(2)
VSUP(SS)
VSUP(S1)
VSUP(S2A)
VSUP(S3A)
VSUP(S3B)
VSUP(S5B)
-0.3 to 27
-100
+75
-150
+100
-0.3 to 40
V
WAKE
Normal Operation within series 2*18 k
 resistor (DC)
Transient input voltage with external component (according to ISO7637-2 & ISO7637-
3 & “Hardware Requirements for LIN, CAN and Flexray Interfaces in Automotive
Applications” specification Rev1.1 / December 2nd, 2009) (See Table 4 and Figure 5)
- Pulse 1 (test up to the limit for Damage - Class D(3))
- Pulse 2a (test up to the limit for Damage - Class D(3))
- Pulse 3a (test up to the limit for Damage - Class D(3))
- Pulse 3b (test up to the limit for Damage - Class D(3))
VWAKE(SS)
VWAKE(S1)
VWAKE(S2A)
VWAKE(S3A)
VWAKE(S3B)
-27 to 40
-100
+75
-150
+100
V
Logic Voltage (RXD, TXD, EN Pins)
VLOG
-0.3 to 5.5
V
LIN Bus Voltage
Normal Operation (DC)
Transient (Coupled Through 1.0 nF Capacitor, according to ISO7637-2 & ISO7637-3
& “Hardware Requirements for LIN, CAN and Flexray Interfaces in Automotive
Applications” specification Rev1.1 / December 2nd, 2009) (See Table 4 and Figure 6)
- Pulse 1 (test up to the limit for Damage - Class D(3))
- Pulse 2a (test up to the limit for Damage - Class D(3))
- Pulse 3a (test up to the limit for Damage - Class D(3))
- Pulse 3b (test up to the limit for Damage - Class D(3))
VBUS(SS)
VBUS(S1)
VBUS(S2A)
VBUS(S3A)
VBUS(S3B)
-27 to 40
-100
+75
-150
+100
V
INH Voltage/Current
DC Voltage
Transient (Coupled Through 1.0 nF Capacitor, according to ISO7637-2 & ISO7637-3
& “Hardware Requirements for LIN, CAN and Flexray Interfaces in Automotive
Applications” specification Rev1.1 / December 2nd, 2009) (See Table 4 and Figure 7)
- Pulse 1 (test up to the limit for Damage - Class D(3))
- Pulse 2a (test up to the limit for Damage - Class D(3))
- Pulse 3a (test up to the limit for Damage - Class D(3))
- Pulse 3b (test up to the limit for Damage - Class D(3))
VINH
VINH(S1)
VINH(S2A)
VINH(S3A)
VINH(S3B)
-0.3 to VSUP +0.3
-100
+75
-150
+100
V
Notes
2.
Class A: All functions of a device/system perform as designed during and after exposure to disturbance.
3.
Class D: At least one function of the transceiver stops working properly during the test, and will return to proper operation automatically
when the exposure to the disturbance has ended. No physical damage of the IC occurs.


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