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MC33662LEF bảng dữ liệu(PDF) 5 Page - Freescale Semiconductor, Inc |
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MC33662LEF bảng dữ liệu(HTML) 5 Page - Freescale Semiconductor, Inc |
5 / 31 page Analog Integrated Circuit Device Data Freescale Semiconductor 5 33662 ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS Table 3. Maximum Ratings All voltages are with respect to ground, unless otherwise noted. Exceeding these ratings may cause a malfunction or permanent damage to the device. Ratings Symbol Value Unit ELECTRICAL RATINGS Power Supply Voltage Normal Operation (DC) Transient input voltage with external component (according to ISO7637-2 & ISO7637- 3 & “Hardware Requirements for LIN, CAN and Flexray Interfaces in Automotive Applications” specification Rev1.1 / December 2nd, 2009) (See Table 4 and Figure 4) - Pulse 1 (test up to the limit for Damage - Class A(2)) - Pulse 2a (test up to the limit for Damage - Class A(2)) - Pulse 3a (test up to the limit for Damage - Class A(2)) - Pulse 3b (test up to the limit for Damage - Class A(2)) - Pulse 5b (Class A)(2) VSUP(SS) VSUP(S1) VSUP(S2A) VSUP(S3A) VSUP(S3B) VSUP(S5B) -0.3 to 27 -100 +75 -150 +100 -0.3 to 40 V WAKE Normal Operation within series 2*18 k resistor (DC) Transient input voltage with external component (according to ISO7637-2 & ISO7637- 3 & “Hardware Requirements for LIN, CAN and Flexray Interfaces in Automotive Applications” specification Rev1.1 / December 2nd, 2009) (See Table 4 and Figure 5) - Pulse 1 (test up to the limit for Damage - Class D(3)) - Pulse 2a (test up to the limit for Damage - Class D(3)) - Pulse 3a (test up to the limit for Damage - Class D(3)) - Pulse 3b (test up to the limit for Damage - Class D(3)) VWAKE(SS) VWAKE(S1) VWAKE(S2A) VWAKE(S3A) VWAKE(S3B) -27 to 40 -100 +75 -150 +100 V Logic Voltage (RXD, TXD, EN Pins) VLOG -0.3 to 5.5 V LIN Bus Voltage Normal Operation (DC) Transient (Coupled Through 1.0 nF Capacitor, according to ISO7637-2 & ISO7637-3 & “Hardware Requirements for LIN, CAN and Flexray Interfaces in Automotive Applications” specification Rev1.1 / December 2nd, 2009) (See Table 4 and Figure 6) - Pulse 1 (test up to the limit for Damage - Class D(3)) - Pulse 2a (test up to the limit for Damage - Class D(3)) - Pulse 3a (test up to the limit for Damage - Class D(3)) - Pulse 3b (test up to the limit for Damage - Class D(3)) VBUS(SS) VBUS(S1) VBUS(S2A) VBUS(S3A) VBUS(S3B) -27 to 40 -100 +75 -150 +100 V INH Voltage/Current DC Voltage Transient (Coupled Through 1.0 nF Capacitor, according to ISO7637-2 & ISO7637-3 & “Hardware Requirements for LIN, CAN and Flexray Interfaces in Automotive Applications” specification Rev1.1 / December 2nd, 2009) (See Table 4 and Figure 7) - Pulse 1 (test up to the limit for Damage - Class D(3)) - Pulse 2a (test up to the limit for Damage - Class D(3)) - Pulse 3a (test up to the limit for Damage - Class D(3)) - Pulse 3b (test up to the limit for Damage - Class D(3)) VINH VINH(S1) VINH(S2A) VINH(S3A) VINH(S3B) -0.3 to VSUP +0.3 -100 +75 -150 +100 V Notes 2. Class A: All functions of a device/system perform as designed during and after exposure to disturbance. 3. Class D: At least one function of the transceiver stops working properly during the test, and will return to proper operation automatically when the exposure to the disturbance has ended. No physical damage of the IC occurs. |
Số phần tương tự - MC33662LEF |
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Mô tả tương tự - MC33662LEF |
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