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LMH2100 bảng dữ liệu(PDF) 3 Page - Texas Instruments |
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LMH2100 bảng dữ liệu(HTML) 3 Page - Texas Instruments |
3 / 43 page LMH2100 www.ti.com SNWS020A – NOVEMBER 2007 – REVISED MARCH 2008 2.7 V DC and AC Electrical Characteristics Unless otherwise specified, all limits are ensured at TA = 25°C, VDD = 2.7V, RF input frequency f = 1855 MHz CW (Continuous Wave, unmodulated). Boldface limits apply at the temperature extremes (1). Symbol Parameter Condition Min Typ Max Units (2) (3) (2) Supply Interface IDD Supply Current Active mode: EN = High, no signal 6.3 7.1 7.9 mA present at RFIN. 5.0 9.2 Shutdown: EN = Low, no signal present 0.5 0.9 at RFIN. 1.9 μA EN = Low: PIN = 0 dBm (4) 10 Logic Enable Interface VLOW EN Logic Low Input Level 0.6 V (Shutdown Mode) VHIGH EN Logic High Input Level 1.1 V IEN Current into EN Pin 50 nA RF Input Interface RIN Input Resistance 46.7 51.5 56.4 Ω Output Interface VOUT Output Voltage Swing From Positive Rail, Sourcing, 15.3 23.9 VREF = 0V, IOUT = 1 mA 28.9 mV From Negative Rail, Sinking, 13.1 22.3 VREF = 2.7V, IOUT = 1 mA 28.3 IOUT Output Short Circuit Current Sourcing, VREF = 0V, VOUT = 2.6V 5.8 7.3 5.2 mA Sinking, VREF = 2.7V, VOUT = 0.1V 6.2 8.3 5.4 BW Small Signal Bandwidth No RF input signal. Measured from REF 416 kHz input current to VOUT RTRANS Output Amp Transimpedance No RF input signal, from IREF to VOUT, 40.7 43.3 46.7 k Ω Gain DC SR Slew Rate Positive, VREF from 2.7V to 0V 3.4 3.9 3.3 V/µs Negative, VREF from 0V to 2.7V 3.8 4.4 3.7 ROUT Output Impedance No RF input signal, EN = High. DC 0.2 1.8 Ω (4) measurement 4.0 IOUT,SD Output Leakage Current in EN = Low, VOUT = 2.0V 100 nA Shutdown mode RF Detector Transfer VOUT,MAX Maximum Output Voltage f = 50 MHz 1.69 1.77 1.82 PIN= −5 dBm f = 900 MHz 1.67 1.78 1.83 (4) f = 1855 MHz 1.57 1.65 1.70 f = 2500 MHz 1.47 1.55 1.60 V f = 3000 MHz 1.38 1.46 1.51 f = 3500 MHz 1.25 1.34 1.40 f = 4000 MHz 1.16 1.25 1.30 (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. (2) All limits are ensured by test or statistical analysis. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped production material. (4) All limits are ensured by design and measurements which are performed on a limited number of samples. Limits represent the mean ±3–sigma values. The typical value represents the statistical mean value. Copyright © 2007–2008, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LMH2100 |
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Mô tả tương tự - LMH2100_14 |
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