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LMH2100 bảng dữ liệu(PDF) 3 Page - Texas Instruments

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LMH2100 bảng dữ liệu(HTML) 3 Page - Texas Instruments

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LMH2100
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SNWS020A – NOVEMBER 2007 – REVISED MARCH 2008
2.7 V DC and AC Electrical Characteristics
Unless otherwise specified, all limits are ensured at TA = 25°C, VDD = 2.7V, RF input frequency f = 1855 MHz CW
(Continuous Wave, unmodulated). Boldface limits apply at the temperature extremes
(1).
Symbol
Parameter
Condition
Min
Typ
Max
Units
(2)
(3)
(2)
Supply Interface
IDD
Supply Current
Active mode: EN = High, no signal
6.3
7.1
7.9
mA
present at RFIN.
5.0
9.2
Shutdown: EN = Low, no signal present
0.5
0.9
at RFIN.
1.9
μA
EN = Low: PIN = 0 dBm
(4)
10
Logic Enable Interface
VLOW
EN Logic Low Input Level
0.6
V
(Shutdown Mode)
VHIGH
EN Logic High Input Level
1.1
V
IEN
Current into EN Pin
50
nA
RF Input Interface
RIN
Input Resistance
46.7
51.5
56.4
Output Interface
VOUT
Output Voltage Swing
From Positive Rail, Sourcing,
15.3
23.9
VREF = 0V, IOUT = 1 mA
28.9
mV
From Negative Rail, Sinking,
13.1
22.3
VREF = 2.7V, IOUT = 1 mA
28.3
IOUT
Output Short Circuit Current
Sourcing, VREF = 0V, VOUT = 2.6V
5.8
7.3
5.2
mA
Sinking, VREF = 2.7V, VOUT = 0.1V
6.2
8.3
5.4
BW
Small Signal Bandwidth
No RF input signal. Measured from REF
416
kHz
input current to VOUT
RTRANS
Output Amp Transimpedance
No RF input signal, from IREF to VOUT,
40.7
43.3
46.7
k
Gain
DC
SR
Slew Rate
Positive, VREF from 2.7V to 0V
3.4
3.9
3.3
V/µs
Negative, VREF from 0V to 2.7V
3.8
4.4
3.7
ROUT
Output Impedance
No RF input signal, EN = High. DC
0.2
1.8
(4)
measurement
4.0
IOUT,SD
Output Leakage Current in
EN = Low, VOUT = 2.0V
100
nA
Shutdown mode
RF Detector Transfer
VOUT,MAX
Maximum Output Voltage
f = 50 MHz
1.69
1.77
1.82
PIN= −5 dBm
f = 900 MHz
1.67
1.78
1.83
(4)
f = 1855 MHz
1.57
1.65
1.70
f = 2500 MHz
1.47
1.55
1.60
V
f = 3000 MHz
1.38
1.46
1.51
f = 3500 MHz
1.25
1.34
1.40
f = 4000 MHz
1.16
1.25
1.30
(1)
Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where TJ > TA.
(2)
All limits are ensured by test or statistical analysis.
(3)
Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(4)
All limits are ensured by design and measurements which are performed on a limited number of samples. Limits represent the mean
±3–sigma values. The typical value represents the statistical mean value.
Copyright © 2007–2008, Texas Instruments Incorporated
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