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LM4570 bảng dữ liệu(PDF) 3 Page - Texas Instruments

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LM4570
www.ti.com
SNOSAV2B – APRIL 2006 – REVISED JULY 2009
Electrical Characteristics VDD = 5V
(1) (2)
The following specifications apply for VDD = 5V, AV-BTL = 6dB unless otherwise specified. Limits apply for TA = 25°C.
LM4570
Units
Parameter
Test Conditions
(Limits)
Typ(3)
Limit(4)(5)
VIN = 0V, IL = 0A, No Load
2.5
5.5
mA (max)
IDD
Quiescent Power Supply Current
VIN = 0V, IL = 0A, RL = 30Ω
2.6
5.5
mA (max)
ISD
Shutdown Current
VSD = GND
0.1
1.5
µA (max)
VIH
Logic Input High
1.4
V (min)
VIL
Logic Input Low
0.4
V (max)
VOS
Output Offset Voltage
5
±35
mV (max)
IOUT
Output Current
VOH, VOL ≤ 250mV
268
mA
TWU
Wake-up time
2.5
ms (max)
RL = 30Ω specified as
VOH
Output High Voltage
146
200
mV (max)
|VDD - VOH|
RL = 30Ω specified as
VOL
Output Low Voltage
106
200
mV (max)
|GND + VOH|
(1)
All voltages are measured with respect to the ground pin, unless otherwise specified.
(2)
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not specify specific performance limits. Electrical Characteristics state DC and AC electrical
specifications under particular test conditions which specify specific performance limits. This assumes that the device is within the
Operating Ratings. Specifications are not specified for parameters where no limit is given; however, the typical value is a good indication
of device performance.
(3)
Typicals are measured at 25°C and represent the parametric norm.
(4)
Limits are ensured to AOQL (Average Outgoing Quality Level).
(5)
Datasheet min/max specification limits are ensured by design, test, or statistical analysis.
Electrical Characteristics VDD = 3V
(1) (2)
The following specifications apply for VDD = 3V, AV-BTL = 6dB unless otherwise specified. Limits apply for TA = 25°C.
LM4570
Units
Parameter
Test Conditions
(Limits)
Typ(3)
Limit(4)(5)
VIN = 0V, IL = 0A, No Load
1.9
4
IDD
Quiescent Power Supply Current
mA (max)
VIN = 0V, IL = 0A, RL = 30Ω
1.95
4
ISD
Shutdown Current(6)
VSD = GND
0.1
1.0
µA (max)
VIH
Logic Input High
1.4
V (min)
VIL
Logic Input Low
0.4
V (max)
VOS
Output Offset Voltage
5
±35
mV (max)
IOUT
Output Current
VOH, VOL ≤ 200mV
192
mA
TWU
Wake-up time
2.4
ms (max)
RL = 30Ω specified as
VOH
Output High Voltage
90
110
mV (max)
|VDD - VOH|
RL = 30Ω specified as
VOL
Output Low Voltage
63
110
mV (max)
|VDD - VOH|
(1)
All voltages are measured with respect to the ground pin, unless otherwise specified.
(2)
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not specify specific performance limits. Electrical Characteristics state DC and AC electrical
specifications under particular test conditions which specify specific performance limits. This assumes that the device is within the
Operating Ratings. Specifications are not specified for parameters where no limit is given; however, the typical value is a good indication
of device performance.
(3)
Typicals are measured at 25°C and represent the parametric norm.
(4)
Limits are ensured to AOQL (Average Outgoing Quality Level).
(5)
Datasheet min/max specification limits are ensured by design, test, or statistical analysis.
(6)
Shutdown current is measured in a normal room environment. Exposure to direct sunlight will increase ISD by a maximum of 2μA.
Copyright © 2006–2009, Texas Instruments Incorporated
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