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ADC12DL066 bảng dữ liệu(PDF) 10 Page - Texas Instruments

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Giải thích chi tiết về linh kiện  Dual 12-Bit, 66 Msps, 450 MHz Input Bandwidth A/D Converter w/Internal Reference
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ADC12DL066
SNAS188F – MAY 2004 – REVISED FEBRUARY 2008
www.ti.com
AC Electrical Characteristics
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD = +3.3V, VDR =
+2.5V, PD = 0V, INT/EXT REF pin = +3.3V, VREF = +1.0V, fCLK = 66 MHz, fIN = 10 MHz, tr = tf = 2 ns, CL = 15 pF/pin.
Boldface limits apply for TJ = TMIN to TMAX: all other limits TJ = 25°C
(1) (2) (3) (4)
Typical
Limits
Units
Symbol
Parameter
Conditions
(5)
(5)
(Limits)
fCLK1
Maximum Clock Frequency
66
MHz (min)
fCLK2
Minimum Clock Frequency
15
MHz
tCH
Clock High Time
6.6
ns (min)
tCL
Clock Low Time
6.6
ns (min)
tCONV
Conversion Latency
6
Clock Cycles
rising
6.6
9.0
ns (max)
VDR = 2.5V
falling
6.0
8.5
ns (max)
tOD
Data Output Delay after Rising CLK Edge
rising
6.4
9.0
ns (max)
VDR = 3.3V
falling
6.5
9.0
ns (max)
tAD
Aperture Delay
2
ns
tAJ
Aperture Jitter
1.2
ps rms
tHOLD
Clock Edge to Data Transition
8
ns
tDIS
Data outputs into Hi-Z Mode
10
ns
tEN
Data Outputs Active after Hi-Z Mode
10
ns
0.1 µF on pins 4, 14; series 1.5
Ω & 1 µF
tPD
Power Down Mode Exit Cycle
500
µs
between pins 5, 6 and between pins 12, 13
(1)
The inputs are protected as shown below. Input voltage magnitudes above VA or below GND will not damage this device, provided
current is limited per (). However, errors in the A/D conversion can occur if the input goes above VA or below GND by more than 100
mV. As an example, if VA is +3.3V, the full-scale input voltage must be ≤+3.4V to ensure accurate conversions.
(2)
To guarantee accuracy, it is required that |VA–VD| ≤ 100 mV and separate bypass capacitors are used at each power supply pin.
(3)
With the test condition for VREF = +1.0V (2VP-P differential input), the 12-bit LSB is 488 µV.
(4)
Timing specifications are tested at TTL logic levels, VIL = 0.4V for a falling edge and VIH = 2.4V for a rising edge.
(5)
Typical figures are at TJ = 25°C, and represent most likely parametric norms. Test limits are guaranteed to National's AOQL (Average
Outgoing Quality Level).
Specification Definitions
APERTURE DELAY is the time after the rising edge of the clock to when the input signal is acquired or held for
conversion.
APERTURE JITTER (APERTURE UNCERTAINTY) is the variation in aperture delay from sample to sample.
Aperture jitter manifests itself as noise in the output.
CLOCK DUTY CYCLE is the ratio of the time during one cycle that a repetitive digital waveform is high to the
total time of one period. The specification here refers to the ADC clock input signal.
COMMON MODE VOLTAGE (VCM) is the common d.c. voltage applied to both input terminals of the ADC.
CONVERSION LATENCY is the number of clock cycles between initiation of conversion and when that data is
presented to the output driver stage. Data for any given sample is available at the output pins the Pipeline Delay
plus the Output Delay after the sample is taken. New data is available at every clock cycle, but the data lags the
conversion by the pipeline delay.
10
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