công cụ tìm kiếm bảng dữ liệu linh kiện điện tử |
|
LMV951MKXNOPB bảng dữ liệu(PDF) 3 Page - National Semiconductor (TI) |
|
|
LMV951MKXNOPB bảng dữ liệu(HTML) 3 Page - National Semiconductor (TI) |
3 / 24 page LMV951 www.ti.com SNOSAI3C – OCTOBER 2006 – REVISED APRIL 2013 1V ELECTRICAL CHARACTERISTICS (1) Unless otherwise specified, all limits specified for at TA = 25°C, V + = 1, V− = 0V, V CM = 0.5V, Shutdown = 0V, and RL = 1 M Ω.Boldface limits apply at the temperature extremes. Symbol Parameter Conditions Min (2) Typ (3) Max (2) Units VOS Input Offset Voltage 1.5 2.8 mV 3.0 TC VOS Input Offset Average Drift 0.15 μV/°C IB Input Bias Current 32 80 nA 85 IOS Input Offset Current 0.2 nA CMRR Common Mode Rejection Ratio 0V ≤ VCM ≤ 1V 67 77 55 dB 0.1V ≤ VCM ≤ 1V 76 85 73 PSRR Power Supply Rejection Ratio 70 92 1V ≤ V+ ≤ 1.8V, VCM = 0.5V 67 dB 68 85 1V ≤ V+ ≤ 3V, VCM = 0.5V 65 VCM Input Common-Mode Voltage Range CMRR ≥ 67 dB 0 1.2 V CMRR ≥ 55 dB 0 1.2 AV Large Signal Voltage Gain VOUT = 0.1V to 0.9V 90 106 RL = 600Ω to 0.5V 85 dB VOUT = 0.1V to 0.9V 90 112 RL = 2 kΩ to 0.5V 86 VOUT Output Voltage Swing High RL = 600Ω to 0.5V 50 25 62 RL = 2 kΩ to 0.5V 25 12 36 mV from rail Output Voltage Swing Low RL = 600Ω to 0.5V 70 32 85 RL = 2 kΩ to 0.5V 35 10 40 IOUT Output Short Circuit Current (4) Sourcing 20 45 VO = 0V, VIN(DIFF) = ±0.2V 15 mA Sinking 20 35 VO = 1V, VIN(DIFF) = ±0.2V 13 IS Supply Current Active Mode VSD <0.4V 370 480 520 μA Shutdown Mode VSD >0.6V 0.01 1.0 3.0 SR Slew Rate See (5) 1.4 V/ μs GBWP Gain Bandwidth Product 2.7 MHz en Input - Referred Voltage Noise f = 1 kHz 25 nV/ √Hz in Input-Referred Current Noise f = 1 kHz 0.2 pA/ √Hz THD Total Harmonic Distortion f = 1 kHz, AV = 1, RL = 1 kΩ 0.02 % ISD Shutdown Pin Current Active Mode, VSD = 0V .001 1 µA Shutdown Mode, VSD = 1V .001 1 VSD Shutdown Pin Voltage Range Active Mode 0 0.4 V Shutdown Mode 0.65 1 (1) Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions is very limited self- heating of the device. (2) All limits are specified by testing or statistical analysis. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production material. (4) The short circuit test is a momentary test, the short circuit duration is 1.5 ms (5) Number specified is the average of the positive and negative slew rates. Copyright © 2006–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LMV951 |
Số phần tương tự - LMV951MKXNOPB |
|
Mô tả tương tự - LMV951MKXNOPB |
|
|
Link URL |
Chính sách bảo mật |
ALLDATASHEET.VN |
Cho đến nay ALLDATASHEET có giúp ích cho doanh nghiệp của bạn hay không? [ DONATE ] |
Alldatasheet là | Quảng cáo | Liên lạc với chúng tôi | Chính sách bảo mật | Trao đổi link | Tìm kiếm theo nhà sản xuất All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |