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2 / 28 page © 2012 Fairchild Semiconductor Corporation 2 FEBSPM3SPM45_M01MTCA • Rev. 1.0.1 Table of Contents 1. Overview of the Evaluation Board (EVB) ................................................................................. 3 2. Key Features............................................................................................................................... 5 3. Specifications ............................................................................................................................. 6 3.1. Safety Precautions ***** WARNING ***** .................................................................7 3.2. Test Configuration #1 .......................................................................................................9 3.3. Test Configuration #2 .....................................................................................................10 3.4. Test Configuration #3 .....................................................................................................11 4. External Connections ............................................................................................................... 12 5. Schematics................................................................................................................................ 13 6. PCB and Assembly Images ...................................................................................................... 19 7. Bill of Materials........................................................................................................................ 22 8. Key Parameter Design.............................................................................................................. 24 8.1. Current-Sensing Circuit ..................................................................................................24 8.2. Short Circuit Protection(SCP) Circuit ............................................................................25 9. VBUS Sense Circuit.................................................................................................................... 26 10. Test Waveforms ...................................................................................................................... 26 10.1. Bulk Capacitor Ripple Current .......................................................................................26 10.2. NTC Temperature ...........................................................................................................27 11. References............................................................................................................................... 27 12. Revision History ..................................................................................................................... 28 |
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