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AD8041ANZ bảng dữ liệu(PDF) 4 Page - List of Unclassifed Manufacturers

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AD8041ANZ bảng dữ liệu(HTML) 4 Page - List of Unclassifed Manufacturers

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STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-96839
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
E
SHEET
4
DSCC FORM 2234
APR 97
1.5 Radiation features.
Device type 02:
Maximum total dose available (dose rate = 50 – 300 rads(Si)/s) .............................................. 100 krads(Si) 4/
Device type 03:
Maximum total dose available (dose rate
 10 mrads(Si)/s) ..................................................... 50 krads(Si) 5/
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
-
Test Method Standard Microcircuits.
MIL-STD-1835 -
Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 -
List of Standard Microcircuit Drawings.
MIL-HDBK-780 -
Standard Microcircuit Drawings.
(Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections and block diagram. The terminal connections and block diagram shall be as specified on figure 1.
3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document
revision level control and shall be made available to the preparing and acquiring activity upon request.
_____
4/
For device type 02, this part may be dose rate sensitive in a space environment and may demonstrate enhanced low
dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified
in MIL-STD-883, method 1019, condition A.
5/
For device type 03, radiation endpoint limits for the noted parameters are guaranteed for the condition specified in
MIL-STD-883, method 1019, condition D.


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