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AD8004AR-14 bảng dữ liệu(PDF) 5 Page - Analog Devices

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Giải thích chi tiết về linh kiện  Quad 3000 V/mu s, 35 mW Current Feedback Amplifier
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REV. C
AD8004
–4–
ABSOLUTE MAXIMUM RATINGS
1
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12.6 V
Internal Power Dissipation . . . . . . . . . . . . . . . . . . . . . Note 2
Input Voltage (Common Mode) . . . . . . . . . . . . . . . . . . . .
±V
S
Differential Input Voltage . . . . . . . . . . . . . . . . . . . . . . .
±2.5 V
Output Short Circuit Duration
. . . . . . . . . . . . . . . . . . . . . . Observe Power Derating Curves
Storage Temperature Range (N, Q, R) . . . . –65
°C to +125°C
Operating Temperature Range
A Grade . . . . . . . . . . . . . . . . . . . . . . . . . . . . –40
°C to +85°C
S Grade . . . . . . . . . . . . . . . . . . . . . . . . . . . –55
°C to +125°C
Lead Temperature Range (Soldering 10 sec) . . . . . . . . +300
°C
NOTES
1Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
2Specification is for device in free air:
14-Lead PDIP Package:
θ
JA = 90
°C/W, θ
JC = 30
°C/W
14-Lead SOIC Package:
θ
JA = 140
°C/W, θ
JC = 30
°C/W
14-Lead CERDIP Package:
θ
JA = 110
°C/W, θ
JC = 30
°C/W
ORDERING GUIDE
Temperature
Package
Package
Model
Range
Description
Option
AD8004AN
– 40
°C to +85°C
14-Lead PDIP
N-14
AD8004AR-14
– 40
°C to +85°C
14-Lead SOIC
R-14
AD8004AR-14-REEL
– 40
°C to +85°C
13" Tape and Reel
R-14
AD8004AR-14-REEL7 – 40
°C to +85°C
7" Tape and Reel
R-14
AD8004SQ
– 55
°C to +125°C 14-Lead CERDIP
Q-14
MAXIMUM POWER DISSIPATION
The maximum power that can be safely dissipated by the
AD8004 is limited by the associated rise in junction temperature.
The maximum safe junction temperature for plastic encapsu-
lated devices is determined by the glass transition temperature
of the plastic, approximately +150
°C. Exceeding this limit
temporarily may cause a shift in parametric performance due to
a change in the stresses exerted on the die by the package.
Exceeding a junction temperature of +175
°C for an extended
period can result in device failure.
While the AD8004 is internally short circuit protected, this may
not be sufficient to guarantee that the maximum junction tem-
perature is not exceeded under all conditions. To ensure proper
operation, it is necessary to observe the maximum power ratings.
61.9
0.1 F
0.1 F
10 F
10 F
499
249
VIN
+VS
–VS
50
SCOPE
INPUT
50
Figure 4. Test Circuit; Gain = –2
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD8004 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
0.1 F
0.1 F
10 F
10 F
604
604
50
VIN
+VS
–VS
50
SCOPE
INPUT
50
Figure 3. Test Circuit; Gain = –2


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Analog Devices
AD8004AR-14 AD-AD8004AR-14 Datasheet
271Kb / 16P
   Quad 3000 V/us, 35 mW Current Feedback Amplifier
REV. B
AD8004AR-14 AD-AD8004AR-14 Datasheet
501Kb / 16P
   Quad 3000 V/?? 35 mW Current Feedback Amplifier
REV. C
AD8004AR-14 AD-AD8004AR-14 Datasheet
715Kb / 17P
   Quad 3000 V/s, 35 mW Current Feedback Amplifier
REV. C
AD8004AR-14-REEL AD-AD8004AR-14-REEL Datasheet
271Kb / 16P
   Quad 3000 V/us, 35 mW Current Feedback Amplifier
REV. B
AD8004AR-14-REEL AD-AD8004AR-14-REEL Datasheet
501Kb / 16P
   Quad 3000 V/?? 35 mW Current Feedback Amplifier
REV. C
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