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LM7322QMAX bảng dữ liệu(PDF) 4 Page - Texas Instruments |
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LM7322QMAX bảng dữ liệu(HTML) 4 Page - Texas Instruments |
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4 / 35 page  LM7321, LM7322 SNOSAW8D – MAY 2008 – REVISED MARCH 2013 www.ti.com 2.7V Electrical Characteristics (1) (continued) Unless otherwise specified, all limits ensured for TA = 25°C, V + = 2.7V, V− = 0V, V CM = 0.5V, VOUT = 1.35V, and RL > 1 MΩ to 1.35V. Boldface limits apply at the temperature extremes. Min Typ Max Symbol Parameter Condition Units (2) (3) (2) GBW Gain Bandwidth f = 50 kHz 16 MHz en Input Referred Voltage Noise Density f = 2 kHz 11.9 nV/ in Input Referred Current Noise Density f = 2 kHz 0.5 pA/ V+ = 1.9V, V− = −0.8V THD+N Total Harmonic Distortion + Noise f = 1 kHz, RL = 100 kΩ, AV = +2 −77 dB VOUT = 210 mVPP CT Rej. Crosstalk Rejection f = 100 kHz, Driver RL = 10 kΩ 60 dB ±5V Electrical Characteristics (1) Unless otherwise specified, all limited ensured for TA = 25°C, V + = 5V, V− = −5V, V CM = 0V, VOUT = 0V, and RL > 1 MΩ to 0V. Boldface limits apply at the temperature extremes. Min Typ Max Symbol Parameter Condition Units (2) (3) (2) −5 ±0.7 +5 VOS Input Offset Voltage VCM = −4.5V and VCM = 4.5V mV −6 +6 VCM = −4.5V and VCM = 4.5V TC VOS Input Offset Voltage Temperature Drift ±2 µV/°C (4) VCM = −4.5V −2.0 −1.2 (5) −2.5 IB Input Bias Current µA VCM = 4.5V 0.45 1.0 (5) 1.5 20 200 IOS Input Offset Current VCM = −4.5V and VCM = 4.5V nA 300 80 100 −5V ≤ VCM ≤ 3V 70 CMRR Common Mode Rejection Ratio dB 65 80 −5V ≤ VCM ≤ 5V 62 78 104 PSRR Power Supply Rejection Ratio 2.7V ≤ VS ≤ 30V, VCM = −4.5V dB 74 −5.3 −5.1 −5.0 CMVR Common Mode Voltage Range CMRR > 50 dB V 5.1 5.3 5.0 −4V ≤ VO ≤ 4V 74 80 RL = 10 kΩ to 0V 70 AVOL Open Loop Voltage Gain dB −4V ≤ VO ≤ 4V 68 74 RL = 2 kΩ to 0V 65 (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. (2) All limits are ensured by testing or statistical analysis. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production material. (4) Offset voltage temperature drift determined by dividing the change in VOS at temperature extremes into the total temperature change. (5) Positive current corresponds to current flowing into the device. 4 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: LM7321 LM7322 |
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