74F133 datasheet(4/8 Pages) ETC1

tên linh kiện	74F133

Giải thích chi tiết về linh kiện	13-input NAND gate

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Philips Semiconductors

Product specification

74F133

13-input NAND gate

July 2, 1993

4

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

NO TAG

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONSNO TAG

MIN

TYP

NO TAG

MAX

UNIT

VO

High level output voltage

VCC = MIN, VIL = MAX

±10%VCC

2.5

V

VOH

High-level output voltage

VIH = MIN, IOH = MAX

±5%VCC

2.7

3.4

V

VO

Low level output voltage

VCC = MIN, VIL = MAX

±10%VCC

0.35

0.50

V

VOL

Low-level output voltage

VIH = MIN, IOL = MAX

±5%VCC

0.35

0.50

V

VIK

Input clamp voltage

VCC = MIN, II = IIK

–0.73

–1.2

V

II

Input current at maximum input voltage

VCC = MAX, VI = 7.0V

100

µA

IIH

High-level input current

VCC = MAX, VI = 2.7V

20

µA

IIL

Low-level input current

VCC = MAX, VI = 0.5V

–0.6

mA

IOS

Short-circuit output currentNO TAG

VCC = MAX

–60

–150

mA

ICC

Supply current (total)

ICCH

VCC = MAX

1.0

2.0

mA

ICC

Supply current (total)

ICCL

VCC = MAX

2.5

4.0

mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

AC ELECTRICAL CHARACTERISTICS

LIMITS

TEST

VCC = +5.0V

VCC = +5.0V ± 10%

SYMBOL

PARAMETER

TEST

CONDITION

Tamb = +25°C

Tamb = 0°C to +70°C

Tamb = –40°C to +85°C

UNIT

CONDITION

CL = 50pF, RL = 500Ω

MIN

TYP

MAX

MIN

MAX

MIN

MAX

tPLH

tPHL

Propagation delay

Dn to Q

Waveform

NO TAG

2.0

2.5

4.0

4.5

7.0

7.5

1.5

2.0

7.5

8.0

1.5

2.0

7.5

8.0

ns

AC WAVEFORMS

VM

Q

Dn

tPHL

tPLH

SF00098

Waveform 1.

Propagation Delay for Data to Outputs

NOTE:

For all waveforms, VM = 1.5V.

Số phần tương tự - 74F133

nhà sản xuất	tên linh kiện	bảng dữ liệu	Giải thích chi tiết về linh kiện
NXP Semiconductors	74F133	51Kb / 4P	13.input NAND Gate July 2, 1993
Nexperia B.V. All right...	74F133	198Kb / 9P	13-input NAND gate July 2, 1993

More results

Mô tả tương tự - 74F133

nhà sản xuất	tên linh kiện	bảng dữ liệu	Giải thích chi tiết về linh kiện
National Semiconductor ...	54LS133	52Kb / 2P	13-INPUT NAND GATE
Toshiba Semiconductor	TC74HC133AP	219Kb / 7P	13-Input NAND Gate
List of Unclassifed Man...	GD74HCT133	165Kb / 4P	13-INPUT NAND GATE
National Semiconductor ...	MM74HC133	149Kb / 4P	13-Input NAND Gate
Renesas Technology Corp	HD74HC133	91Kb / 6P	13-input NAND Gate
Fairchild Semiconductor	DM74S133	46Kb / 4P	13-Input NAND Gate
NXP Semiconductors	74F133	51Kb / 4P	13.input NAND Gate July 2, 1993
STMicroelectronics	M54HC133	237Kb / 10P	13 INPUT NAND GATE
NXP Semiconductors	74HC133	36Kb / 5P	13-input NAND gate September 1993
Hitachi Semiconductor	HD74HC133	52Kb / 9P	13-input NAND Gate

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