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ADS7817UBG4 bảng dữ liệu(PDF) 11 Page - Texas Instruments

tên linh kiện ADS7817UBG4
Giải thích chi tiết về linh kiện  12-Bit Differential Input Micro Power Sampling
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Trang chủ  http://www.ti.com
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ADS7817
11
SBAS066A
D
OUT
1.4V
Test Point
3k
100pF
C
LOAD
t
r
D
OUT
V
OH
V
OL
t
f
t
dDO
t
hDO
D
OUT
DCLOCK
V
OH
V
OL
V
IL
D
OUT
Test Point
t
dis Waveform 2, ten
t
dis Waveform 1
100pF
C
LOAD
3k
t
dis
CS/SHDN
DOUT
Waveform 1(1)
DOUT
Waveform 2(2)
90%
10%
V
IH
1
B11
2
t
en
CS/SHDN
DCLOCK
V
OL
D
OUT
V
CC
Load Circuit for tdDO, tr, and tf
Voltage Waveforms for DOUT Rise and Fall Times tr, and tf
Voltage Waveforms for DOUT Delay Times, tdDO
Load Circuit for tdis and tden
Voltage Waveforms for ten
FIGURE 5. Timing Diagrams and Test Circuits for the Parameters in Table I.
Voltage Waveforms for tdis
NOTES: (1) Waveform 1 is for an output with internal conditions such that
the output is HIGH unless disabled by the output control. (2) Waveform 2
is for an output with internal conditions such that the output is LOW unless
disabled by the output control.
1000
100
10
1
1
10
100
1000
Sample Rate (kHz)
T
A = 25°C
V
CC = +5V
V
REF = +2.5V
f
CLK = 3.2MHz
FIGURE 6. Maintaining fCLK at the Highest Possible Rate
Allows Supply Current to Drop Directly with
Sample Rate.
FIGURE 7. Scaling fCLK Reduces Supply Current Only
Slightly with Sample Rate.
1000
100
10
1
1
10
100
1000
Sample Rate (kHz)
T
A = 25°C
V
CC = +5V
V
REF = +2.5V
f
CLK = 16 • fSAMPLE


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