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ADS1192IRSMR bảng dữ liệu(PDF) 2 Page - Texas Instruments |
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ADS1192IRSMR bảng dữ liệu(HTML) 2 Page - Texas Instruments |
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2 / 67 page  ADS1191 ADS1192 SBAS566A – DECEMBER 2011 – REVISED SEPTEMBER 2012 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. FAMILY AND ORDERING INFORMATION(1) MAXIMUM OPERATING PACKAGE PACKAGE NUMBER OF ADC SAMPLE TEMPERATU RESPIRATION PRODUCT OPTION DESIGNATOR CHANNELS RESOLUTION RATE (kSPS) RE RANGE CIRCUITRY –40°C to TQFP PBS 1 16 8 No +85°C ADS1191IPBS –40°C to QFN RSM 1 24 8 No +85°C –40°C to TQFP PBS 2 16 8 No +85°C ADS1192IPBS –40°C to QFN RSM 2 24 8 No +85°C –40°C to TQFP PBS 1 24 8 No +85°C ADS1291IPBS –40°C to QFN RSM 1 24 8 No +85°C –40°C to TQFP PBS 2 24 8 No +85°C ADS1292IPBS –40°C to QFN RSM 2 24 8 No +85°C –40°C to TQFP PBS 2 24 8 Yes +85°C ADS1292RIPBS –40°C to QFN RSM 2 24 8 Yes +85°C (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the device product folder at www.ti.com. ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature range, unless otherwise noted. VALUE UNIT AVDD to AVSS –0.3 to +7 V DVDD to DGND –0.3 to +7 V AVSS to DGND –3 to +0.2 V Analog input to AVSS AVSS – 0.3 to AVDD + 0.3 V Digital input to DVDD DVSS – 0.3 to DVDD + 0.3 V Input current to any pin except supply pins(2) ±10 mA Momentary ±100 mA Input current Continuous ±10 mA Operating temperature range Industrial-grade devices only –40 to +85 °C Storage temperature range –60 to +150 °C Maximum junction temperature (TJ) +150 °C Human body model (HBM) ±1000 V JEDEC standard 22, test method A114-C.01, all pins Electrostatic discharge (ESD) ratings Charged device model (CDM) ±500 V JEDEC standard 22, test method C101, all pins (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. (2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing beyond the supply rails must be current limited to 10 mA or less. 2 Submit Documentation Feedback Copyright © 2011–2012, Texas Instruments Incorporated Product Folder Links: ADS1191 ADS1192 |
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