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LMH6551MAX_NOPB bảng dữ liệu(PDF) 3 Page - Texas Instruments |
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LMH6551MAX_NOPB bảng dữ liệu(HTML) 3 Page - Texas Instruments |
3 / 28 page LMH6551 www.ti.com SNOSAK7C – FEBRUARY 2005 – REVISED MARCH 2013 ±5V Electrical Characteristics (1) Single ended in differential out, TA= 25°C, G = +1, VS = ±5V, VCM = 0V, RF = RG = 365Ω, RL = 500Ω; Unless specified Boldface limits apply at the temperature extremes. Symbol Parameter Conditions Min (2) Typ (3) Max (2) Units AC Performance (Differential) SSBW Small Signal −3 dB Bandwidth VOUT = 0.5 VPP 370 MHz LSBW Large Signal −3 dB Bandwidth VOUT = 2 VPP 340 MHz Large Signal −3 dB Bandwidth VOUT = 4 VPP 320 MHz 0.1 dB Bandwidth VOUT = 2 VPP 50 MHz Slew Rate 4V Step(4) 2400 V/ μs Rise/Fall Time 2V Step 1.8 ns Settling Time 2V Step, 0.05% 18 ns VCM Pin AC Performance (Common Mode Feedback Amplifier) Common Mode Small Signal VCMbypass capacitor removed 200 MHz Bandwidth Distortion and Noise Response HD2 VO = 2 VPP, f = 5 MHz, RL=800Ω −94 dBc HD2 VO = 2 VPP, f = 20MHz, RL=800Ω −85 dBc HD3 VO = 2 VPP, f = 5 MHz, RL=800Ω −96 dBc HD3 VO = 2 VPP, f = 20 MHz, RL=800Ω −72 dBc en Input Referred Voltage Noise Freq ≥ 1 MHz 6.0 nV/ √Hz in Input Referred Noise Current Freq ≥ 1 MHz 1.5 pA/ √Hz Input Characteristics (Differential) VOSD Input Offset Voltage Differential Mode, VID = 0, VCM = 0 0.5 ±4 mV ±6 Input Offset Voltage Average (5) −0.8 µV/°C Temperature Drift IBI Input Bias Current (6) -4 0 µA -10 Input Bias Current Average (5) −2.6 nA/°C Temperature Drift Input Bias Difference Difference in Bias currents between the 0.03 µA two inputs CMRR Common Mode Rejection Ratio DC, VCM = 0V, VID = 0V 72 80 dBc RIN Input Resistance Differential 5 M Ω CIN Input Capacitance Differential 1 pF CMVR Input Common Mode Voltage Range CMRR > 53dB +3.1 +3.2 V −4.6 −4.7 VCMPin Input Characteristics (Common Mode Feedback Amplifier) VOSC Input Offset Voltage Common Mode, VID = 0 0.5 ±5 mV ±8 Input Offset Voltage Average (5) 8.2 µV/°C Temperature Drift Input Bias Current (6) −2 μA (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. (2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation using Statistical Quality Control (SQC) methods. (3) Typical numbers are the most likely parametric norm. (4) Slew Rate is the average of the rising and falling edges. (5) Drift determined by dividing the change in parameter at temperature extremes by the total temperature change. (6) Negative input current implies current flowing out of the device. Copyright © 2005–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LMH6551 |
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