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TL16C550CFN bảng dữ liệu(PDF) 9 Page - Texas Instruments

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TL16C550C, TL16C550CI
ASYNCHRONOUS COMMUNICATIONS ELEMENT
WITH AUTOFLOW CONTROL
SLLS177H − MARCH 1994 − REVISED JANUARY 2006
9
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
standard voltage (5 V nominal) (continued)
MIN
NOM
MAX
UNIT
Junction temperature range, TJ
(see Note 6)
0
25
115
°C
Oscillator/clock speed
16
MHz
NOTE 6: These junction temperatures reflect simulated conditions. Absolute maximum junction temperature is 150
°C. The customer is
responsible for verifying junction temperature.
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted)
low voltage (3.3 V nominal)
PARAMETER
TEST CONDITIONS
MIN
TYP†
MAX
UNIT
VOH‡
High-level output voltage
IOH = − 1 mA
2.4
V
VOL‡
Low-level output voltage
IOL = 1.6 mA
0.5
V
Il
Input current
VCC = 3.6 V,
VSS = 0,
10
A
Il
Input current
VCC = 3.6 V,
VI = 0 to 3.6 V,
VSS = 0,
All other terminals floating
10
µA
VCC = 3.6 V,
VSS = 0,
IOZ
High-impedance-state output current
VCC = 3.6 V,
VSS = 0,
VO = 0 to 3.6 V,
±20
µA
IOZ
High-impedance-state output current
VO = 0 to 3.6 V,
Chip selected in write mode or chip deselect
±20
µA
VCC = 3.6 V,
TA = 25°C,
VCC = 3.6 V,
TA = 25°C,
SIN, DSR, DCD, CTS, and RI at 2 V,
ICC
Supply current
CC
A
SIN, DSR, DCD, CTS, and RI at 2 V,
All other inputs at 0.8 V,
XTAL1 at 4 MHz,
8
mA
ICC
Supply current
SIN, DSR, DCD, CTS, and RI at 2 V,
All other inputs at 0.8 V,
XTAL1 at 4 MHz,
No load on outputs,
Baud rate = 50 kbit/s
8
mA
All other inputs at 0.8 V,
XTAL1 at 4 MHz,
No load on outputs,
Baud rate = 50 kbit/s
Ci(CLK)
Clock input capacitance
V
= 0,
V
= 0,
15
20
pF
Co(CLK) Clock output capacitance
VCC = 0,
VSS = 0,
f = 1 MHz,
TA = 25°C,
20
30
pF
Ci
Input capacitance
CC
SS
f = 1 MHz,
TA = 25°C,
All other terminals grounded
6
10
pF
Co
Output capacitance
All other terminals grounded
10
20
pF
† All typical values are at VCC = 3.3 V and TA = 25°C.
‡ These parameters apply for all outputs except XOUT.
standard voltage (5 V nominal)
PARAMETER
TEST CONDITIONS
MIN
TYP†
MAX
UNIT
VOH‡
High-level output voltage
IOH = − 1 mA
2.4
V
VOL‡
Low-level output voltage
IOL = 1.6 mA
0.4
V
Il
Input current
VCC = 5.25 V,
VSS = 0,
10
A
Il
Input current
VCC = 5.25 V,
VI = 0 to 5.25 V,
VSS = 0,
All other terminals floating
10
µA
VCC = 5.25 V,
VSS = 0,
IOZ
High-impedance-state output current
VCC = 5.25 V,
VSS = 0,
VO = 0 to 5.25 V,
±20
µA
IOZ
High-impedance-state output current
VO = 0 to 5.25 V,
Chip selected in write mode or chip deselect
±20
µA
VCC = 5.25 V,
TA = 25°C,
VCC = 5.25 V,
TA = 25°C,
SIN, DSR, DCD, CTS, and RI at 2 V,
ICC
Supply current
CC
A
SIN, DSR, DCD, CTS, and RI at 2 V,
All other inputs at 0.8 V,
XTAL1 at 4 MHz,
10
mA
ICC
Supply current
SIN, DSR, DCD, CTS, and RI at 2 V,
All other inputs at 0.8 V,
XTAL1 at 4 MHz,
No load on outputs,
Baud rate = 50 kbit/s
10
mA
All other inputs at 0.8 V,
XTAL1 at 4 MHz,
No load on outputs,
Baud rate = 50 kbit/s
Ci(CLK)
Clock input capacitance
V
= 0,
V
= 0,
15
20
pF
Co(CLK) Clock output capacitance
VCC = 0,
VSS = 0,
f = 1 MHz,
TA = 25°C,
20
30
pF
Ci
Input capacitance
CC
SS
f = 1 MHz,
TA = 25°C,
All other terminals grounded
6
10
pF
Co
Output capacitance
All other terminals grounded
10
20
pF
† All typical values are at VCC = 5 V and TA = 25°C.
‡ These parameters apply for all outputs except XOUT.


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