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ADM1181A bảng dữ liệu(PDF) 8 Page - Analog Devices |
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ADM1181A bảng dữ liệu(HTML) 8 Page - Analog Devices |
8 / 12 page ADM202E/ADM1181A –8– REV. 0 Table I. IEC1000-4-2 Compliance Levels Level Contact Discharge Air Discharge 1 2 kV 2 kV 2 4 kV 4 kV 3 6 kV 8 kV 4 8 kV 15 kV Table II. ADM202E/ADM1181A ESD Test Results ESD Test Method I/O Pins Other Pins MIL-STD-883B ±15 kV ±3 kV IEC1000-4-2 Contact ±8 kV Air ±15 kV FAST TRANSIENT BURST TESTING (IEC1000-4-4) IEC1000-4-4 (previously 801-4) covers electrical fast-transient/ burst (EFT) immunity. Electrical fast transients occur as a re- sult of arcing contacts in switches and relays. The tests simulate the interference generated when for example a power relay dis- connects an inductive load. A spark is generated due to the well known back EMF effect. In fact the spark consists of a burst of sparks as the relay contacts separate. The voltage appearing on the line therefore consists of a bust of extremely fast transient impulses. A similar effect occurs when switching on fluorescent lights. The fast transient burst test defined in IEC1000-4-4 simulates this arcing and its waveform is illustrated in Figure 11. It con- sists of a burst of 2.5 kHz to 5 kHz transients repeating at 300 ms intervals. It is specified for both power and data lines. 300ms 15ms t V 5ns 0.2/0.4ms 50ns V t Figure 15. IEC1000-4-4 Fast Transient Waveform A simplified circuit diagram of the actual EFT generator is illus- trated in Figure 16. The transients are coupled onto the signal lines using an EFT coupling clamp. The clamp is 1 m long and it completely sur- rounds the cable providing maximum coupling capacitance (50 pF to 200 pF typ) between the clamp and the cable. High energy transients are capacitively coupled onto the signal lines. Fast rise times (5 ns) as specified by the standard result in very effective coupling. This test is very severe since high voltages are coupled onto the signal lines. The repetitive transients can often cause problems where single pulses don’t. Destructive latchup may be induced due to the high energy content of the tran- sients. Note that this stress is applied while the interface prod- ucts are powered up and are transmitting data. The EFT test applies hundreds of pulses with higher energy than ESD. Worst case transient current on an I/O line can be as high as 40 A. RC RM CC HIGH VOLTAGE SOURCE L ZS CD 50 Ω OUTPUT Figure 16. IEC1000-4-4 Fast Transient Generator Test results are classified according to the following: 1. Normal performance within specification limits. 2. Temporary degradation or loss of performance that is self-recoverable. 3. Temporary degradation or loss of function or performance that requires operator intervention or system reset. 4. Degradation or loss of function that is not recoverable due to damage. The ADM202E/ADM1181A have been tested under worst case conditions using unshielded cables and meet Classification 2. Data transmission during the transient condition is corrupted, but it may be resumed immediately following the EFT event without user intervention. |
Số phần tương tự - ADM1181A |
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Mô tả tương tự - ADM1181A |
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