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ADM1032ARM bảng dữ liệu(PDF) 5 Page - Analog Devices

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ADM1032
–5–
FUNCTIONAL DESCRIPTION
The ADM1032 is a local and remote temperature sensor and
over-temperature alarm. When the ADM1032 is operating
normally, the on-board A-to-D converter operates in a free-
running mode. The analog input multiplexer alternately selects
either the on-chip temperature sensor to measure its local tem-
perature, or the remote temperature sensor. These signals are
digitized by the ADC and the results stored in the Local and
Remote Temperature Value Registers.
The measurement results are compared with local and remote,
high, low and
THERM temperature limits, stored in nine on-
chip registers. Out-of-limit comparisons generate flags that are
stored in the Status Register, and one or more out-of limit results
will cause the
ALERT output to pull low. Exceeding THERM
temperature limits cause the
THERM output to assert low.
The limit registers can be programmed, and the device con-
trolled and configured, via the serial System Management Bus
(SMBus). The contents of any register can also be read back via
the SMBus.
Control and configuration functions consist of:
• Switching the device between normal operation and
standby mode.
• Masking or enabling the ALERT output.
• Selecting the conversion rate.
MEASUREMENT METHOD
A simple method of measuring temperature is to exploit the
negative temperature coefficient of a diode, or the base-emitter
voltage of a transistor, operated at constant current. Unfortu-
nately, this technique requires calibration to null out the effect
of the absolute value of VBE, which varies from device to device.
The technique used in the ADM1032 is to measure the change
in VBE when the device is operated at two different currents.
This is given by:
where:
K is Boltzmann’s constant (1.38
× 10–23).
q is charge on the electron (1.6
× 10–19 Coulombs).
T is absolute temperature in Kelvins.
N is ratio of the two currents.
nf is the ideality factor of the thermal diode.
The ADM1032 is trimmed for an ideality factor of 1.008.
Figure 2 shows the input signal conditioning used to measure
the output of an external temperature sensor. This figure shows
the external sensor as a substrate transistor, provided for tem-
perature monitoring on some microprocessors, but it could
equally well be a discrete transistor. If a discrete transistor is
used, the collector will not be grounded, and should be linked to
the base. To prevent ground noise interfering with the measure-
ment, the more negative terminal of the sensor is not referenced
to ground, but is biased above ground by an internal diode at
the D– input. If the sensor is operating in a noisy environment,
C1 may optionally be added as a noise filter. Its value is typi-
cally 2200 pF, but should be no more than 3000 pF. See the
section on Layout Considerations for more information on C1.
To measure
∆VBE, the sensor is switched between operating cur-
rents of I and N
× I. The resulting waveform is passed through
a 65 kHz low-pass filter to remove noise, thence to a chopper-
stabilized amplifier that performs the functions of amplification
and rectification of the waveform to produce a dc voltage pro-
portional to
∆VBE. This voltage is measured by the ADC to give
a temperature output in two’s complement format. To further
reduce the effects of noise, digital filtering is performed by aver-
aging the results of 16 measurement cycles.
Signal conditioning and measurement of the internal tempera-
ture sensor is performed in a similar manner.
TEMPERATURE DATA FORMAT
One LSB of the ADC corresponds to 0.125
°C, so the ADC can
measure from 0
°C to 127.875°C. The temperature data format
is shown in Tables I and II.
The results of the local and remote temperature measurements
are stored in the Local and Remote Temperature Value Registers,
and are compared with limits programmed into the Local and
Remote High and Low Limit Registers.
Table I. Temperature Data Format (Local Temperature and
Remote Temperature High Byte)
Temperature
Digital Output
0
°C
0 000 0000
1
°C
0 000 0001
10
°C
0 000 1010
25
°C
0 001 1001
50
°C
0 011 0010
75
°C
0 100 1011
100
°C
0 110 0100
125
°C
0 111 1101
127
°C
0 111 1111
C1*
D+
D–
REMOTE
SENSING
TRANSISTOR
IN
I
IBIAS
VDD
VOUT+
TO ADC
VOUT–
BIAS
DIODE
LOW-PASS FILTER
fC = 65kHz
CAPACITOR C1 IS OPTIONAL. IT SHOULD ONLY BE USED IN NOISY ENVIRONMENTS.
C1 = 2.2nF TYPICAL, 3nF MAX.
*
Figure 2. Input Signal Conditioning
∆Vn KT
q
In N
BE
f
=
()
×
()


Số phần tương tự - ADM1032ARM

nhà sản xuấttên linh kiệnbảng dữ liệuGiải thích chi tiết về linh kiện
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ON Semiconductor
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Mô tả tương tự - ADM1032ARM

nhà sản xuấttên linh kiệnbảng dữ liệuGiải thích chi tiết về linh kiện
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ON Semiconductor
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