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ADG709 bảng dữ liệu(PDF) 4 Page - Analog Devices

tên linh kiện ADG709
Giải thích chi tiết về linh kiện  CMOS, 3 ohm Low Voltage 4-/8-Channel Multiplexers
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ADG709 bảng dữ liệu(HTML) 4 Page - Analog Devices

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–4–
REV. 0
ADG708/ADG709–SPECIFICATIONS1
DUAL SUPPLY
B Version
C Version
–40 C
–40 C
Parameter
+25 C
to +85 C
+25 C to +85 C
Unit
Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range
VSS to VDD
VSS to VDD
V
On-Resistance (RON)
2.5
2.5
Ω typ
VS = VSS to VDD, IDS = 10 mA;
4.5
5
4.5
5
Ω max
Test Circuit 1
On-Resistance Match Between
0.4
0.4
Ω typ
Channels (
∆R
ON)
0.8
0.8
Ω max
VS = VSS to VDD, IDS = 10 mA
On-Resistance Flatness (RFLAT(ON))
0.6
0.6
Ω typ
VS = VSS to VDD, IDS = 10 mA
1.0
1.0
Ω max
LEAKAGE CURRENTS
VDD = +3.3 V, VSS = –3.3 V
Source OFF Leakage IS (OFF)
±0.01
±0.01
nA typ
VS = +2.25 V/–1.25 V, VD = –1.25 V/+2.25 V;
±20
±0.1
±0.3
nA max
Test Circuit 2
Drain OFF Leakage ID (OFF)
±0.01
±0.01
nA typ
VS = +2.25 V/–1.25 V, VD = –1.25 V/+2.25 V;
±20
±0.1
±0.75
nA max
Test Circuit 3
Channel ON Leakage ID, IS (ON)
±0.01
±0.01
nA typ
VS = VD = +2.25 V/–1.25 V, Test Circuit 4
±20
±0.1
±0.75
nA max
DIGITAL INPUTS
Input High Voltage, VINH
2.0
2.0
V min
Input Low Voltage, VINL
0.4
0.4
V max
Input Current
IINL or IINH
0.005
0.005
µA typ
VIN = VINL or VINH
±0.1
±0.1
µA max
CIN, Digital Input Capacitance
2
2
pF typ
DYNAMIC CHARACTERISTICS
2
tTRANSITION
14
14
ns typ
RL = 300 Ω, CL = 35 pF, Test Circuit 5
25
25
ns max
VS = 1.5 V/0 V, Test Circuit 5
Break-Before-Make Time Delay, tD
8
8
ns typ
RL = 300 Ω, CL = 35 pF
1
1
ns min
VS = 1.5 V, Test Circuit 6
tON(EN)
14
14
ns typ
RL = 300 Ω, CL = 35 pF
25
25
ns max
VS = 1.5 V, Test Circuit 7
tOFF(EN)
8
8
ns typ
RL = 300 Ω, CL = 35 pF
15
15
ns max
VS = 1.5 V, Test Circuit 7
Charge Injection
±3
±3
pC typ
VS = 0 V, RS = 0 Ω, CL = 1 nF;
Test Circuit 8
Off Isolation
–60
–60
dB typ
RL = 50 Ω, CL = 5 pF, f = 10 MHz
–80
–80
dB typ
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 9
Channel-to-Channel Crosstalk
–60
–60
dB typ
RL = 50 Ω, CL = 5 pF, f = 10 MHz
–80
–80
dB typ
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 10
–3 dB Bandwidth
55
55
MHz typ
RL = 50 Ω, CL = 5 pF, Test Circuit 9
CS (OFF)
13
13
pF typ
CD (OFF)
ADG708
85
85
pF typ
ADG709
42
42
pF typ
CD, CS (ON)
ADG708
96
96
`
pF typ
ADG709
48
48
pF typ
POWER REQUIREMENTS
VDD = 3.3 V
IDD
0.001
0.001
µA typ
Digital Inputs = 0 V or 3.3 V
1.0
1.0
µA max
ISS
0.001
0.001
µA typ
VSS = –3.3 V
1.0
1.0
µA max
Digital Inputs = 0 V or 3.3 V
NOTES
1Temperature range is as follows: B and C Versions: –40
°C to +85°C.
2Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
(VDD = +3 V
10%, VSS = –3 V
10%, GND = 0 V)


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