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AD5320BRT bảng dữ liệu(PDF) 5 Page - Analog Devices |
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5 / 12 page AD5320 –5– REV. B TERMINOLOGY Relative Accuracy For the DAC, relative accuracy or Integral Nonlinearity (INL) is a measure of the maximum deviation, in LSBs, from a straight line passing through the endpoints of the DAC transfer func- tion. A typical INL vs. code plot can be seen in Figure 2. Differential Nonlinearity Differential Nonlinearity (DNL) is the difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of ±1 LSB maximum ensures monotonicity. This DAC is guaranteed monotonic by design. A typical DNL vs. code plot can be seen in Figure 3. Zero-Code Error Zero-code error is a measure of the output error when zero code (000 Hex) is loaded to the DAC register. Ideally the output should be 0 V. The zero-code error is always positive in the AD5320 because the output of the DAC cannot go below 0 V. It is due to a combination of the offset errors in the DAC and output amplifier. Zero-code error is expressed in mV. A plot of zero-code error vs. temperature can be seen in Figure 6. Full-Scale Error Full-scale error is a measure of the output error when full-scale code (FFF Hex) is loaded to the DAC register. Ideally the output should be VDD – 1 LSB. Full-scale error is expressed in percent of full-scale range. A plot of full-scale error vs. tempera- ture can be seen in Figure 6. Gain Error This is a measure of the span error of the DAC. It is the devia- tion in slope of the DAC transfer characteristic from ideal expressed as a percent of the full-scale range. Total Unadjusted Error Total Unadjusted Error (TUE) is a measure of the output error taking all the various errors into account. A typical TUE vs. code plot can be seen in Figure 4. Zero-Code Error Drift This is a measure of the change in zero-code error with a change in temperature. It is expressed in µV/°C. Gain Error Drift This is a measure of the change in gain error with changes in temperature. It is expressed in (ppm of full-scale range)/ °C. Digital-to-Analog Glitch Impulse Digital-to-analog glitch impulse is the impulse injected into the analog output when the input code in the DAC register changes state. It is normally specified as the area of the glitch in nV secs and is measured when the digital input code is changed by 1 LSB at the major carry transition (7FF Hex to 800 Hex). See Figure 19. Digital Feedthrough Digital feedthrough is a measure of the impulse injected into the analog output of the DAC from the digital inputs of the DAC but is measured when the DAC output is not updated. It is specified in nV secs and measured with a full-scale code change on the data bus, i.e., from all 0s to all 1s and vice versa. |
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