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LM317MBT bảng dữ liệu(PDF) 3 Page - ON Semiconductor |
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3 / 14 page LM317M, NCV317MAB, NCV317MB http://onsemi.com 3 ELECTRICAL CHARACTERISTICS (VI − VO = 5.0 V; IO = 0.1 A, TJ = Tlow to Thigh (Note 7), unless otherwise noted.) Characteristics Figure Symbol LM317MA / LM317MAB/NCV317MAB Unit Min Typ Max Line Regulation (Note 8) (TA = 25°C, 3.0 V ≤ VI − VO ≤ 40 V) 3 Regline − 0.01 0.04 %/V Load Regulation (Note 8) TA = 25°C, 10 mA ≤ IO ≤ 0.5 A VO ≤ 5.0 V VO ≥ 5.0 V 4 Regload − − 5.0 0.1 25 0.5 mV % VO Adjustment Pin Current 5 IAdj − 50 100 mA Adjustment Pin Current Change 2.5 V ≤ VI − VO ≤ 40 V, 10 mA ≤ IL ≤ 0.5 A, PD ≤ Pmax 3, 4 DIAdj − 0.2 5.0 mA Reference Voltage 3.0 V ≤ VI − VO ≤ 40 V, 10 mA ≤ IL ≤ 0.5 A, PD ≤ Pmax 5 Vref 1.225 1.250 1.275 V Line Regulation (Note 8) 3.0 V ≤ VI−VO ≤ 40 V 3 Regline − 0.02 0.07 %/V Load Regulation (Note 8) 10 mA ≤ IO ≤ 0.5 A VO ≤ 5.0 V VO ≥ 5.0 V 4 Regload − − 20 0.3 70 1.5 mV % VO Temperature Stability (Tlow ≤ TJ ≤ Thigh) 5 TS − 0.7 − % VO Minimum Load Current to Maintain Regulation (VI − VO = 40 V) 5 ILmin − 3.5 10 mA Maximum Output Current VI − VO ≤ 15 V, PD ≤ Pmax VI − VO = 40 V, PD ≤ Pmax, TA = 25°C 5 Imax 0.5 0.15 0.9 0.25 − − A RMS Noise, % of VO (TA = 25°C, 10 Hz ≤ f ≤ 10 kHz) − N − − − % VO Ripple Rejection, VO = 10 V, f = 120 Hz (Note 9) Without CAdj CAdj = 10 mF 6 RR − 66 65 80 − − dB Thermal Shutdown (Note 10) − − − 180 − °C Long−Term Stability, TJ = Thigh (Note 11) TA= 25°C for End−point Measurements 5 S − 0.3 1.0 %/1.0 kHrs. 7. Tlow to Thigh = 0° to +125°C for LM317MA Tlow to Thigh = −40° to +125°C for LM317MAB, NCV317MAB. 8. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account separately. Pulse testing with low duty cycle is used. 9. CAdj, when used, is connected between the adjustment pin and ground. 10.Thermal characteristics are not subject to production test. 11. Since Long−Term Stability cannot be measured on each device before shipment, this specification is an engineering estimate of average stability from lot−to−lot. |
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