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công cụ tìm kiếm bảng dữ liệu linh kiện điện tử |
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công cụ tìm kiếm bảng dữ liệu linh kiện điện tử |
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ADS8320-HT bảng dữ liệu(PDF) 4 Page - Texas Instruments |
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ADS8320-HT bảng dữ liệu(HTML) 4 Page - Texas Instruments |
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4 / 27 page  ADS8320-HT SBAS521A – DECEMBER 2010 – REVISED APRIL 2012 www.ti.com ABSOLUTE MAXIMUM RATINGS Over operating free-air temperature range (unless otherwise noted). (1) UNIT VCC 6 V Analog input voltage -0.3 to 6 V Case temperature 100 °C Junction temperature –55 to 210 °C Storage temperature –55 to 210 °C External referance voltage 5.5 V Input current to any pin except supply ±10 mA (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. THERMAL CHARACTERISTICS FOR HKJ OR HKQ PACKAGE over operating free-air temperature range (unless otherwise noted) PARAMETER MIN TYP MAX UNIT to ceramic side of case 5.7 θJC Junction-to-case thermal resistance °C/W to top of case lid (metal side of case) 13.7 ELECTRICAL CHARACTERISTICS VCC = 2.7 V, VREF = 2.5 V, -IN = GND, fSAMPLE = 100 kHz and fCLK = 24 x fSAMPLE, unless otherwise noted. CONDITIONS TA = -55°C to 125°C TA = 210°C (1) UNIT PARAMETER MIN TYP MAX MIN TYP MAX Resolution 16 16 Bits Analog Input Full-zcale input span +IN – (–IN) 0 VREF 0 VREF V +IN –0.1 VCC + 0.1 –0.1 VCC + 0.1 Absolute input range V –IN –0.1 0.5 –0.1 0.5 Capacitance 45 45 pF Leakage current 1 1 nA System Performance No missing codes 14 14 Bits Integral linearity error ±0.008 ±0.032 ±0.018 ±0.034 % of FSR Offset error VIN = 3 V ±0.6 ±3.8 ±0.5 ±3.8 mV Offset temperature drift VIN = 3 V ±3 ±4 μV/°C Gain error VIN = 3 V ±0.05 ±0.05 % of FSR Gain temperature drift VIN = 3 V ±0.3 ±0.3 ppm/°C Noise 20 21 μVrms Power-supply rejection ratio 2.7 V < VCC < 3.3 V 3 5 LSB(2) (1) Minimum and maximum parameters are characterized for operation at TA = 210°C, but may not be production tested at that temperature. Production test limits with statistical guardbands are used to ensure high temperature performance. (2) LSB means least significant bit. With VREF = 2.5 V, one LSB is 0.038 V. 4 Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Link(s): ADS8320-HT |
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