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MCM6229BBEJ15 bảng dữ liệu(PDF) 3 Page - Motorola, Inc |
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MCM6229BBEJ15 bảng dữ liệu(HTML) 3 Page - Motorola, Inc |
3 / 8 page MCM6229BB 3 MOTOROLA FAST SRAM CAPACITANCE (f = 1.0 MHz, dV = 3.0 V, TA = 25°C, Periodically Sampled Rather Than 100% Tested) Characteristic Symbol Typ Max Unit Input Capacitance All Inputs Except Clocks and DQs E, G, and W Cin Cck 4 5 6 8 pF I/O Capacitance DQ CI/O 5 8 pF AC OPERATING CONDITIONS AND CHARACTERISTICS (VCC = 5.0 V ± 10%, TA = 0 to + 70°C, Unless Otherwise Noted) Input Pulse Levels 0 to 3.0 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input Rise/Fall Time 2 ns . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input Timing Measurement Reference Level 1.5 V . . . . . . . . . . . . . . . Output Timing Measurement Reference Level 1.5 V . . . . . . . . . . . . . Output Load See Figure 1a . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . READ CYCLE TIMING (See Notes 1, 2, and 3) 6229BB–15 6229BB–17 6229BB–20 6229BB–25 6229BB–35 Parameter Symbol Min Max Min Max Min Max Min Max Min Max Unit Notes Read Cycle Time tAVAV 15 — 17 — 20 — 25 — 35 — ns 3 Address Access Time tAVQV — 15 — 17 — 20 — 25 — 35 ns Enable Access Time tELQV — 15 — 17 — 20 — 25 — 35 ns 4 Output Enable Access Time tGLQV — 6 — 7 — 7 — 8 — 8 ns Output Hold from Address Change tAXQX 3 — 3 — 3 — 3 — 3 — ns Enable Low to Output Active tELQX 5 — 5 — 5 — 5 — 5 — ns 5, 6, 7 Output Enable Low to Output Active tGLQX 0 — 0 — 0 — 0 — 0 — ns 5, 6, 7 Enable High to Output High–Z tEHQZ 0 6 0 7 0 7 0 8 0 8 ns 5, 6, 7 Output Enable High to Output High–Z tGHQZ 0 6 0 7 0 7 0 8 0 8 ns 5, 6, 7 NOTES: 1. W is high for read cycle. 2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus con- tention conditions during read and write cycles. 3. All timings are referenced from the last valid address to the first transitioning address. 4. Addresses valid prior to or coincident with E going low. 5. At any given voltage and temperature, tEHQZ max is less than tELQX min, and tGHQZ max is less than tGLQX min, both for a given device and from device to device. 6. Transition is measured ± 500 mV from steady–state voltage with load of Figure 1b. 7. This parameter is sampled and not 100% tested. 8. Device is continuously selected (E ≤ VIL, G ≤ VIL). OUTPUT Z0 = 50 Ω RL = 50 Ω VL = 1.5 V (a) (b) 5 pF +5 V OUTPUT 255 Ω 480 Ω The table of timing values shows either a minimum or a maximum limit for each param- eter. Input requirements are specified from the external system point of view. Thus, ad- dress setup time is shown as a minimum since the system must supply at least that much time. On the other hand, responses from the memory are specified from the de- vice point of view. Thus, the access time is shown as a maximum since the device never provides data later than that time. TIMING LIMITS Figure 1. AC Test Loads |
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