MCM62Y308

7

MOTOROLA FAST SRAM

AC OPERATING CONDITIONS AND CHARACTERISTICS

FOR THE TEST ACCESS PORT (IEEE 1149.1)

(TA = 0 to + 70°C, Unless Otherwise Noted)

Input Pulse Levels

0 to 3.0 V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Input Rise/Fall Time

3 ns

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Input Timing Measurement Reference Level

1.5 V

. . . . . . . . . . . . . . .

Output Timing Reference Level

1.5 V

. . . . . . . . . . . . . . . . . . . . . . . . . .

Output Load

50 Ohm Transmission Line

. . . . . . . . . . . . . . . . . . . . . . .

TAP CONTROLLER TIMING

MCM62Y308–17

Parameter

Symbol

Min

Max

Unit

Notes

Cycle Time

tCYC

30

—

ns

Clock High Time

tCKH

12

—

ns

Clock Low Time

tCKL

12

—

ns

Clock Low to Output Valid

tA

5

9

ns

Clock Low to Output High–Z

tCKZ

0

9

ns

1

Clock Low to Output Active

tCKX

0

9

ns

2, 3

Setup Time, Test Mode Select

tS

2

—

ns

Setup Time, Test Data In

tSD

2

—

ns

Hold Time, Test Mode Select

tH

2

—

ns

Hold Time, Test Data In

tHD

2

—

ns

NOTES:

1. Test Data Out will High–Z from a clock low edge depending on the current state of the TAP state machine.

2. Test Data Out is active only in the SHIFT–IR and SHIFT–DR state of the TAP state machine.

3. Transition is measured

± 500 mV from steady–state voltage. This parameter is sampled and not 100% tested.

tA

tCKX

tCKZ

tHD

tCKH

tCKL

tS

tH

TAP CONTROLLER TIMING DIAGRAM

tSD

tCYC

TEST CLOCK

(TCK)

TEST MODE SELECT

(TMS)

TEST DATA IN

(TDI)

TEST DATA OUT

(TDO)