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ADS4249IRGCT bảng dữ liệu(PDF) 8 Page - Texas Instruments

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ADS4249IRGCT bảng dữ liệu(HTML) 8 Page - Texas Instruments

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ADS4249
SBAS534B
– JULY 2011 – REVISED SEPTEMBER 2011
www.ti.com
TIMING REQUIREMENTS: LVDS and CMOS Modes
Typical values are at +25
°C, AVDD = 1.8 V, DRVDD = 1.8 V, sampling frequency = 250 MSPS, sine wave input
clock, CLOAD = 5 pF, and RLOAD = 100 Ω, unless otherwise noted. Minimum and maximum values are across the
full temperature range: TMIN = –40°C to TMAX = +85°C, AVDD = 1.8 V, and DRVDD = 1.7 V to 1.9 V.
Table 2. LVDS and CMOS Modes(1)
PARAMETER
DESCRIPTION
MIN
TYP
MAX
UNIT
tA
Aperture delay
0.5
0.8
1.1
ns
Aperture delay matching
Between the two channels of the same device
±70
ps
Between two devices at the same temperature and
Variation of aperture delay
±150
ps
DRVDD supply
tJ
Aperture jitter
140
fS rms
Time to valid data after coming out of STANDBY
50
100
µs
mode
Wakeup time
Time to valid data after coming out of GLOBAL
100
500
µs
power-down mode
Clock
Default latency after reset
16
cycles
ADC latency(2)
Clock
Digital functions enabled (EN DIGITAL = 1)
24
cycles
DDR LVDS MODE(3)
tSU
Data setup time
Data valid(4) to zero-crossing of CLKOUTP
0.6
0.88
ns
Zero-crossing of CLKOUTP to data becoming
tH
Data hold time
0.33
0.55
ns
invalid(4)
Input clock rising edge cross-over to output clock
tPDI
Clock propagation delay
5.0
6.0
7.5
ns
rising edge cross-over
Duty cycle of differential clock,
LVDS bit clock duty cycle
48
%
(CLKOUTP-CLKOUTM)
Rise time measured from
–100 mV to +100 mV
tRISE,
Data rise time,
Fall time measured from +100 mV to
–100 mV
0.13
ns
tFALL
Data fall time
1 MSPS
≤ Sampling frequency ≤ 250 MSPS
Rise time measured from
–100 mV to +100 mV
tCLKRISE,
Output clock rise time,
Fall time measured from +100 mV to
–100 mV
0.13
ns
tCLKFALL
Output clock fall time
1 MSPS
≤ Sampling frequency ≤ 250 MSPS
PARALLEL CMOS MODE
Input clock rising edge cross-over to output clock
tPDI
Clock propagation delay
4.5
6.2
8.5
ns
rising edge cross-over
Duty cycle of output clock, CLKOUT
Output clock duty cycle
50
%
1 MSPS
≤ Sampling frequency ≤ 200 MSPS
Rise time measured from 20% to 80% of DRVDD
tRISE,
Data rise time,
Fall time measured from 80% to 20% of DRVDD
0.7
ns
tFALL
Data fall time
1 MSPS
≤ Sampling frequency ≤ 200 MSPS
Rise time measured from 20% to 80% of DRVDD
tCLKRISE,
Output clock rise time
Fall time measured from 80% to 20% of DRVDD
0.7
ns
tCLKFALL
Output clock fall time
1 MSPS
≤ Sampling frequency ≤ 200 MSPS
(1)
Timing parameters are ensured by design and characterization and not tested in production.
(2)
At higher frequencies, tPDI is greater than one clock period and overall latency = ADC latency + 1.
(3)
Measurements are done with a transmission line of 100-
Ω characteristic impedance between the device and the load. Setup and hold
time specifications take into account the effect of jitter on the output data and clock.
(4)
Data valid refers to a logic high of +100 mV and a logic low of
–100 mV.
8
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© 2011, Texas Instruments Incorporated
Product Folder Link(s): ADS4249


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