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ADXRS649BBGZ-RL bảng dữ liệu(PDF) 10 Page - Analog Devices |
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10 / 12 page ADXRS649 Rev. 0 | Page 10 of 12 TEMPERATURE OUTPUT AND CALIBRATION It is common practice to temperature-calibrate gyros to improve their overall accuracy. The ADXRS649 has a temperature propor- tional voltage output that provides input to such a calibration method. The temperature sensor structure is shown in Figure 19. The temperature output is characteristically nonlinear, and any load resistance connected to the TEMP output results in decreasing the TEMP output and its temperature coefficient. Therefore, buffering the output is recommended. The voltage at TEMP (F3, G3) is nominally 2.5 V at 25°C, and VRATIO = 5 V. The temperature coefficient is ~9 mV/°C at 25°C. Although the TEMP output is highly repeatable, it has only modest absolute accuracy. VRATIO TEMP RFIXED RTEMP Figure 19. Temperature Sensor Structure MODIFYING THE MEASUREMENT RANGE The ADXRS649 scale factor can be reduced to extend the measurement range to as much as ±50,000°/sec by adding a single 120 kΩ resistor between the RATEOUT and SUMJ pins. If an external resistor is added between RATEOUT and SUMJ, COUT must be proportionally increased to maintain correct bandwidth. NULL BIAS ADJUSTMENT The nominal 2.5 V null bias is for a symmetrical swing range at RATEOUT (B1, A2). However, a nonsymmetric output swing may be suitable in some applications. Null bias adjustment is possible by injecting a suitable current to SUMJ (C1, C2). Note that supply disturbances may reflect some null bias instability. Digital supply noise should be avoided, particularly in this case. SELF-TEST FUNCTION The ADXRS649 includes a self-test feature that actuates each of the sensing structures and associated electronics in the same manner, as if subjected to angular rate. The self-test is activated by standard logic high levels applied to Input ST1 (F5, G5), Input ST2 (F4, G4), or both. ST1 causes the voltage at RATEOUT to change by approximately −0.15 V, and ST2 causes an opposite change of +0.15 V. The self-test response follows the viscosity temperature dependence of the package atmosphere, approximately 0.25%/°C. Activating ST1 and ST2 simultaneously does not damage the part. ST1 and ST2 are fairly closely matched (±2%), but actuating both simultaneously may result in a small apparent null bias shift proportional to the degree of self-test mismatch. ST1 and ST2 are activated by applying a voltage equal to VRATIO to the ST1 pin and the ST2 pin. The voltage applied to ST1 and ST2 must never be greater than AVCC. CONTINUOUS SELF-TEST The on-chip integration of the ADXRS649 gives it higher reliability than is obtainable with any other high volume manufacturing method. In addition, it is manufactured under a mature BiMOS process that has field-proven reliability. As an additional failure detection measure, a power-on self-test can be performed. How- ever, some applications may warrant continuous self-test while sensing rate. Information about continuous self-test techniques is also available in the AN-768 Application Note, Using the ADXRS150/ADXRS300 in Continuous Self-Test Mode. |
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